ZnS0.8Se0.2 film for high resolution liquid crystal light valve

The structural characteristics and optical and electrical properties of molecular-beam-epitaxy (MBE) grown ZnS0.8Se0.2 thin films on indium-tin-oxide (ITO) glass substrates were investigated in this work. The X-ray diffraction (XRD) results indicated that high quality polycrystalline ZnS0.8Se0.2 thin film grown at the optimized temperature had a preferred orientation along the (111) planes. The transmission electron microscopy (TEM) cross-sectional micrograph of the sample showed a well defined columnar structure with lateral crystal dimension in the order of a few hundred angstroms. Ultraviolet(UV) photoresponsivity as high as 0.01 A/W had been demonstrated and for wavelengths longer than 450 nm, the response was down from the peak response by more than 3 orders of magnitude. The thin ZnS0.8Se0,2 photosensor layer, with a wide energy gap and anisotropic electrical property, makes a transmission UV liquid crystal light valve (LCLV) with high resolution feasible.     

Microstructure and properties of indium tin oxide thin films deposited by RF-magnetron sputtering

Tin-doped indium oxide （ITO） thin films were prepared using conventional radio frequency （RF） planar magnetron sputtering equipped with IR irradiation using a ceramic target of In2O3/SnO2 with a mass ratio of 1：1 at various IR irradiation temperatures T1 （from room temperature to 400 ℃ ）. The refractive index, deposited ratio, and resistivity are functions of the sputtering Ar gas pressure. The microstructure of ITO thin films is related to IR T are amorphous at the temperature ranging from 1, the crystalline seeds appear at T1 = 300℃, and the films 27 ℃ to 400 ℃.     

Molecular dynamics simulations of non-Fourier heat conduction

Unsteady heat conduction is known to deviate significantly from Fourier＇s law when the system time and length scales are within certain temporal and spatial windows of relaxation. Classical molecular dynamics simulations were used to investigate unsteady heat conduction in argon thin films with a sudden temperature increase or heat flux at one surface to study the non-Fourier heat conduction effects in argon thin films. The studies were conducted with both pure argon films and films with vacancy defects. The temperature profiles in the argon films showed the existence of mechanical waves when the thin film was suddenly heated and the wave nature of the heat propagation. The flux phase relaxation time, Zq, and the temperature phase relaxation time,τt, were calculated from the temporal variations of the energy flux and temperature distribution in the film. Comparisons of the MD temperature profiles with temperature profiles predicted by Fourier＇s law show that Fourier＇s law is not able to predict the temperature variations with time. Different film thicknesses were also studied to illustrate the variation of the time needed for the films to reach steady-state temperature profiles after a sudden temperature rise at one surface and to illustrate the finite speed of the energy waves.     

Study of phase separation in Ga25Se75 xTex chalcogenide thin films

The effects of composition and thermal annealing in between glass transition and crystallization temperature on the optical and structural properties of Ga25Se75-xTex were investigated. The glass transition and crystallization temperature of the synthesized samples was measured by non-isothermal DSC measurements. Amorphous thin films of Ga25Se75-xTex glasses were grown onto ultra clean glass/Si wafer (100) substrates using the vacuum evaporation technique. The effect of thermal annealing on the optical gap (Eg) for Ga25Se75-xTex thin films in the temperature range 358-388K is studied. As-prepared and annealed thin films were characterized by X-ray diffraction, field emission scanning electron microscopy, energy dispersive X-ray spectroscopy and optical absorption. Thermal annealing was found to be accompanied by structural effects, which in turn, lead to changes in the optical constants. The optical absorption coefficient (a) for as-deposited and thermally annealed films was calculated from the absorbance data. From the knowledge of absorption coefficient at different wavelengths, the optical band gap (Eg) was calculated for all compositions of Ga25Se75-xTex thin films before and after thermal annealing. Results indicate that allowed indirect optical transition is predominated in as-deposited and thermally annealed thin films. The influence of Te incorporation and thermal annealing in Ga25Se75-xTex thin films results in a gradual decrease in the indirect optical gap, this behaviorcan be explained as increased tailing. The decrease in optical band gap and an increase in absorption coefficient and extinction coefficient with thermal annealing can be attributed to transformation from amorphous to crystalline phase.     

Effects of substrate temperature and ambient oxygen pressure on growth of Ba(Fe1/2Nb1/2)O3 thin films by pulsed laser deposition

Ba(Fe1/2Nb1/2)O3 thin films were grown on Pt/TiO2/SiO2/Si substrates with pulsed laser deposition (PLD) at temperatures ranging from 823 to 923 K with the varied ambient oxygen pressure. X-ray diffraction (XRD) data confirmed the single phase of polycrystalline Ba(Fe1/2Nb1/2)O3 thin films. The effects of substrate temperature and ambient oxygen pressure on the surface morphologies of the thin films were investigated by atomic force microscopy (AFM) and the growth dynamics of thin films was discussed. Larger grains and denser surface morphologies were observed with increasing substrate temperature. While finer grains were produced with increasing ambient oxygen pressure due to more frequent collisions between the ejected species and ambient oxygen molecules. The influence of the substrate temperature and ambient oxygen pressure on the dielectric properties was also discussed. Improved dielectric constant and decreased dielectric loss was observed for the thin film deposited at evaluated temperature.     

Electrical properties of sulfur-implanted cubic boron nitride thin films

Cubic boron nitride(c-BN)thin films were deposited on Si substrates by applying ion beam assisted deposition and then doped by S ion implantation.To produce a uniform depth profile of S ions in c-BN films,the implantation was carried out for the multiple energies.A slight degradation of c-BN crystallinity resulted from ion implantation can be recovered by thermal annealing,keeping the cubic phase content as high as 92%.The resistance reduces from 1010X for the as-deposited c-BN film to 108X after an S implantation of 5 9 1014ions cm-2and annealing at 1,173 K,suggesting an electrical doping effect of S dopant.The electrical resistance of the S-doped c-BN thin film decreases with increasing temperature,indicating semiconductor characteristics.The activation energy of S dopant is estimated to be 0.28±0.01 eV from the temperature dependence of resistance.     

Transient photoconductivity in a-(Se80Te20)100 xAgx (0rxr4) thin films

Bulk material of (Se80Te20)100 xAgx (0rxr4) system was prepared by using a conventional melt quenching technique. Thin films of a-(Se80Te20)100 xAgx (0rxr4) were deposited by the vacuum evaporation technique at a base pressure of 10 4 mbar onto well-cleaned glass substrates. Temperature dependence of electrical conductivity in the temperature range of 263–333 K has been studied. There is increase in the value of conductivity with increase in temperature as well as with Ag content. The measurements of intensity dependence of photoconductivity show that the photoconductivity increases with intensity as a power law where the power is found to be between 0.5 and 1.0, representing the continuous distribution of traps. Rise and decay of photocurrent with time at room temperature at different light intensities for (Se80Te20)98Ag2 thin film samples have also been reported. The results have been explained on the basis of the Dember voltage and interaction between photoexcited holes and the trapped electrons on the surface.     

Photo-induced optical changes in GexAs40Se60-x thin films

Ge-As-Se chalcogenide thin films show a wide range of photosensitivity, which is utilized for the fabrication of micro-optical elements for integrated optics. The photosensitivity of GexAs40Se60?x(x=0,15) chalcogenide thin films for UV light was presented. For that purpose, the bulk samples of GexAs40Se60?x(x=0,15) chalcogenide glasses were prepared using conventional melt quenching technique, and thin films were prepared using thermal evaporation technique. These thin films were exposed to UV light for two hours. Amorphous natures of bulk samples and thin films were verified by XRD and chemical compositions were verified by EDX measurements. The thicknesses of the thin films were measured using a thickness profilometer. Linear optical analysis of these thin films was done using transmission spectra in wavelength range of 300?900 nm. Optical bandgap was determined by first peak of transmission derivative as well as extrapol ation of Tauc’s plot. R2 analysis was done using R software to ensure that the material is indirect bandgap material. It is observed that two hours UV exposure causes photo-darkening along with photo-expansion in As40Se60 thin films, while photo-bleach ing and photo-densification for Ge15As40Se45 thin films. However, the amounts of photo-induced optical changes for Ge15As40Se45 thin films are smaller than those for As40Se60 thin films. The changes in optical absorption, bandgap and thickness are understood base d on the bonding rearrangement caused by UV exposure.     

Structure and 57Fe conversion electron Mössbauer spectroscopy study of Mn-Zn ferrite nanocrystal thin films by electroless plating in aqueous solution

Mn1-xZnxFe2O4thin films with various Zn contents and of different thickness were synthesized on glass substrates directly by electroless plating in aqueous solution at 90℃ without heat treatment. The Mn-Zn ferrite films have a single spinel phase structure and well-crystallized columnar grains growing per- pendicularly to the substrates. The results of conversion electron ^57Fe Mossbauer spectroscopy （CEMS） Indicate that the cation distribution of Mn1-xZnxFe204 ferrite nanocrystal thin films fabricated by electroless plating is different from the bulk materials＇ and a great quantity of Fe^3＋ ions are still present on A sites for x〉0.5. When the Zn content of the films increases, Fe^3＋ ions in the films transfer from A sites to B sites and the hyperfine magnetic field reduces, suggesting that Zn2. has strong chemical affinity towards the A sites. On the other side, with the increase of the thickness of the films, Fe3＋ ions, at B sites in the spinel structure, increase and the array of magnetic moments no longer lies in the thin film plane completely. At x = 0.5, Hc and Ms of Mn1-xZnxFe204thin films show a minimum of 3.7 kA/m and a maximum of 419.6 kA/m, respectively.     

Structure,optical,and magnetic properties of Mn-doped ZnO films prepared by sputtering

<正>The microstructural,optical,and magnetic properties and room-temperature photoluminescence(PL) of Mn-doped ZnO thin films were studied.The chemical compositions were examined by energy dispersive X-ray spectroscopy(EDS) and the charge state of Mn ions in the ZnO:Mn films was characterized by X-ray photoelectronic spectrometry(XPS).From the X-ray diffraction(XRD) data of the samples,it can be found that Mn doping does not change the orientation of ZnO thin films.All the films prepared have a wurtzite structure and grow mainly along the c-axis orientation.The grain size and the residual stress were calculated from the XRD results.The optical transmittance of the film decreases with the increase of manganese content in ZnO.The room-temperature photoluminescence of the films shows that the intensity of near band energy(NBE) emission depends strongly on the Mn content.The hysteresis behavior indicates that the films with the Mn content below 9at%are ferromagnetic at room temperature.     

Synthesis and characterization of semiconductor zinc sulfide nanotubes by soft-template method

ZnS nanotubes have been successfully synthe-sized from solutions containing a surfactant, Triton X-100(t-octyl-(OCH2CH2)χOH, χ=9, 10). X-ray diffraction (XRD),transmission electron microscope (TEM) and selected areaelectron diffraction (SAED) are employed to characterize thestructure and morphology of as-synthesized product. XRDand SAED pattern indicate that as-obtained products consist of pure polycrystalline cubic-phase ZnS structures. TEM images reveal that most of the products are tubular struc-tures, with diameters ranging between 37--52 nm andlengths up to 3 μm. The wall thickness of as-obtained ZnSnanotube is around 9 nm. The growth mechanism of ZnSnanotubes has also be proposed.     

化学浴沉积法制备ZnS薄膜的研究

基于化学浴沉积法,采用硫酸锌、硫脲、水合肼和氨水混合溶液于适当温度下在玻璃衬底上沉积得到表面均匀的ZnS薄膜.对在不同沉积时间以及退火时间下得到的ZnS薄膜运用X射线衍射法观测其晶型结构,发现较长的沉积时间(5 h)和退火时间(3 h)制得的薄膜结晶度好,且检测出为闪锌矿晶型.并对其透光性能做了检测,发现pH值对透光度有显著影响.     

One-pot hydrothermal synthesis and fabrication of kesterite Cu2ZnSn(S,Se)4 thin films

Kesterite Cu_2Zn Sn(S,Se)_4(CZTSSe)powder was synthesized by a hydrothermal process.The thin films were fabricated by physical vapor deposition of CZTSSe powder followed by a thermal annealing process.The kesterite microstructure was identified by the X-ray diffraction and Raman spectroscopy.The morphology and elemental composition of CZTSSe thin films were also investigated.The dependence of resistance on the temperature of CZTSSe film was measured and the thermal activation energy of conductivity was estimated to be 0.33 eV based on Arrhenius plot of resistance versus temperature.A high absorption coefficient(10~4cm~(-1))of CZTSSe was found in the visible and NIR regions of the spectrum.A direct band gap structure with band gap energy of 1.46 eV was also estimated for CZTSSe films.The photoconductivity was measured under both AM 1.5G and NIR illumination and a stable and fully recoverable photoconductivity was observed for both asdeposited and annealed CZTSSe films.The annealed films show a higher photoconductivity than the as-deposited films under both AM 1.5G and NIR lights.     

Nd掺杂BST薄膜的微结构与光学特性研究

用改进的溶胶-凝胶技术,在硅和石英衬底上制备了不同浓度的Nd掺杂Ba0.80Sr0.20TiO3薄膜,应用XRD和SEM表征了薄膜的晶化行为和微观形貌.测试发现700℃退火后,薄膜晶化情况良好,具有典型的多晶钙钛矿结构,表面致密,无裂纹和孔洞,晶粒生长均匀,随着Nd掺杂量的增加,晶粒尺寸逐渐减小.在200~1 000 nm的波长范围内测试了薄膜的透射谱,用"包络法"计算了薄膜的折射率,薄膜折射率与波长呈现典型的电子带间跃迁的色散关系,波长为400 nm时,1%Nd(按物质的量计算百分比)掺杂的BST薄膜的折射率为2.06,小于纯BST薄膜的折射率2.10,这是由于Nd掺杂引起薄膜内部应力变化造成薄膜折射率降低.由吸收谱和Tauc关系确定了Nd掺杂对薄膜的光学带隙的影响.     

ZnS和C60纳米线阵列的构筑和表征

以多孔氧化铝为模板,通过水热反应制备出ZnS 和 C₆₀纳米线阵列,分别用透射电子显微镜(TEM)、扫描电子显微镜(SEM)、X射线衍射(XRD)、拉曼光谱以及选区电子衍射图谱(SAED)等,对纳米线阵列形貌和化学成分进行表征.结果表明,ZnS 和C₆₀纳米线均为有序阵列.ZnS纳米线为多晶结构,在波长332 nm紫外光激发下, 发射519 nm特征荧光.同时介绍了水热条件下,在多孔氧化铝模板中填充目的产物,以及制备纳米线有序阵列的相关过程.该方法具有一定的普适性.     

TiO2-x(V2O5)纳米复合薄膜的光吸收

采用溶胶 -凝胶技术 ,以Ti(C4H9O) 4 和V2 O5粉末为原材料制备了纳米结构的TiO2 -x(V2 O5) (x为V2 O5的质量分数 ,分别为 10 % ,2 0 % ,30 % ,10 0 % )复合薄膜 .采用原子力显微镜观察薄膜的表面形貌 ;使用UV VIS NIR分光光度计测量了复合薄膜在紫外 -可见光波段的透射率和反射率光谱 ,研究其光吸收特性 .实验结果表明 :复合薄膜具有纳米颗粒结构 ;随着V2 O5用量的增加 ,复合薄膜在紫外光区的吸收逐渐增加 ,(αhv) 1/ 2 与hv存在线性关系 ,光学带隙由纯TiO2 的 3.36eV减小为x =30 %时的 2 .83eV ,光学带隙与x满足Eg(x) =Eg(0 ) [Eg(1)-Eg(0 ) -b]x bx2 关系式 ;复合薄膜光吸收边缘红移起因于V2 O5复合后薄膜中定域态宽度的增加 .     

直流反应磁控溅射制备Zn_(1-x)Cd_xO薄膜的结构和光学性能研究

利用直流反应磁控溅射的方法在玻璃衬底上沉积了(002)方向高度择优生长的纤锌矿结构的Zn1-xCdxO(x=0,0.2)合金薄膜.利用XRD、XPS、TEM、PL对薄膜的结构和光学性能进行了详细研究.结果表明,随着x=0到x=0.2,(002)衍射峰从34.36°偏移到33.38°,(002)方向的晶面间距从0.260 nm增加到0.268 nm,Zn1-xCdxO薄膜的光学带隙也从3.20 eV减小到2.70 eV,相应的近带边发光峰从393 nm红移到467 nm.另外,我们还从能带结构观点对Zn1-xCdxO薄膜的发光机理进行了研究.     

Tb3+和Gd3+掺杂的纳米TiO2薄膜的制备及发光性能与发光机

以钛酸正丁酯［Ti(OBu)₄］为前驱体, 采用溶胶 凝胶法制备Tb³⁺和Gd³⁺共掺杂的纳米TiO₂发光薄膜, 并探讨了Gd³⁺对Tb³⁺的增敏作用机理. 通过X射线衍射(XRD)、 TG/DTA综合热分析仪、 傅里叶变换红外仪(FTIR)、 透射电子显微镜（TEM）和光致发光(PL)光谱分别对不同制备条件下的TiO₂薄膜进行了表征. 结果表明, TiO₂薄膜具有一定的择优取向, 晶相为锐钛矿相, 形成了良好有序的晶体结构, 且样品粒径分布均匀, 颗粒大小约为15 nm; 以230 nm作为激发光, Gd³⁺的共掺对纳米TiO₂发光薄膜中Tb³⁺的发光有显著增强作用.     

用PLD法在MgO(100)衬底上生长ZnO薄膜的结构和光学特性

用脉冲激光沉积法在MgO(100)衬底上沉积了ZnO薄膜.衬底温度分别为400℃、550℃和700℃.利用X射线衍射(XRD)和光致发光谱(PL)对薄膜的结构和光学性能进行研究.X射线衍射的结果表明,在400℃和550℃下生长的ZnO薄膜具有高度c-轴择优取向,但是当衬底温度升高到700℃时,薄膜由单一的择优取向变为有两个较强的择优取向.通过光致发光谱可以发现,在550℃下生长的ZnO薄膜具有强的紫外发射和窄的FWHM,并且紫外发光峰的强度与ZnO薄膜的结晶质量密切相关.