| 基于可控多扫描使能信号的片上系统TR-TC联合测试成本模型 |
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| 引用本文： | 张金艺,黄徐辉,蔡万林,翁寒一.基于可控多扫描使能信号的片上系统TR-TC联合测试成本模型[J].上海交通大学学报,2011,45(7):1026-1030. |
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| 作者姓名： | 张金艺 黄徐辉 蔡万林 翁寒一 |
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| 作者单位： | （ 上海大学 a.特种光纤与光接入网省部共建教育部重点实验室；b.微电子研究与开发中心；c.教育部新型显示与系统应用重点实验室，上海200072 ) |
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| 基金项目： | 上海市科委资助项目(08706201000,08700741000); 上海市教委重点学科资助项目(J50104); 上海大学创新基金资助项目(A10-0109-08-017) |
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| 摘 要： | 基于片上系统的扫描链结构，针对全速测试研究了多扫描使能（SE）信号的可测性设计，并建立了新颖的测试资源 覆盖率（TR-TC）联合测试成本线性规划数学模型.研究结果表明，该模型不仅可以高效控制全速测试的测试资源消耗以及可测性设计复杂度，而且还可以确立SE信号数量的最优上限，进而避免了以盲目提升SE信号数量来提高转换故障覆盖率的纯理论方式，使面向片上系统全速测试的多SE信号可测性设计方法有一个可靠的目标控制值.
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| 关 键 词： | 全速测试 转换故障 扫描使能 测试成本 |
| 收稿时间： | 2010-07-19 |
TR-TC Associated Test Cost Mathematical Model in SoC Using Controllable Multi-Scan-Enable |
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| ZHANG Jin-yia,b,c,HUANG Xu-huib,CAI Wan-linb,WENG Han-yia,c,Ministryof Education,b.Microelectronic Research & Development Center,c.Key Laboratory of AdvancedDisplays , System Application,Ministry of Education,Shanghai University,Shanghai ,China.TR-TC Associated Test Cost Mathematical Model in SoC Using Controllable Multi-Scan-Enable[J].Journal of Shanghai Jiaotong University,2011,45(7):1026-1030. |
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| Authors: | ZHANG Jin-yia b c HUANG Xu-huib CAI Wan-linb WENG Han-yia c Ministryof Education bMicroelectronic Research & Development Center cKey Laboratory of AdvancedDisplays System Application Ministry of Education Shanghai University Shanghai China |
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| Institution: | (a. Key Laboratory of Special Fiber Optics and Optical Access Networks (Shanghai University), Ministry of Education； b.Microelectronic Research & Development Center； c.Key Laboratory of Advanced Displays and System Application, Ministry of Education, Shanghai University， Shanghai 200072， China) |
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| Abstract: | Based on the scan chain structure of SoC(System-on-Chip),this paper described a method of multi-Scan-Enable DFT for at-speed testing to improve the transition fault coverage.A TR-TC(Test Resources-Test Coverage) associated test cost mathematical model was built.The results show that the TR-TC model can effectively control the complexity of at-speed DFT and establish the optimization number of Scan-Enable,which provides a reliable target control value in multi-Scan-Enable at-speed DFT. |
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| Keywords: | at-speed transition fault Scan-Enable test cost |
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