首页 | 本学科首页   官方微博 | 高级检索  
     检索      

SRAM型FPGA互连资源单故障的一种检测方法
引用本文:徐健,黄维康.SRAM型FPGA互连资源单故障的一种检测方法[J].复旦学报(自然科学版),1999,38(3):348-352.
作者姓名:徐健  黄维康
作者单位:复旦大学电子工程系
摘    要:采用三次编程的方法对SRAM到FPGA中连线资源模型的单故障进行检测与定位,在给定的故障模型下,三次编程并施加文中所给测试向量集T后,可使单故障的故障覆盖率达100%,对线段(Segment)的stuckat故障,开路故障,桥接故障可定位到线段。

关 键 词:SRAM型FPGA  故障模型  故障检测  故障诊断  现场可编程门阵列器件  互连资源模型

A Test Method for Single Fault in Interconnects of SRAM Based FPGAs
Xu Jian,Huang Weikang.A Test Method for Single Fault in Interconnects of SRAM Based FPGAs[J].Journal of Fudan University(Natural Science),1999,38(3):348-352.
Authors:Xu Jian  Huang Weikang
Institution:Department of Electronic Engineering
Abstract:A three step programming method to detect single fault in SRAM Based FPGA interconnection resources is proposed. A single fault model is given. Fault detection for the fault model are discussed. A 100% fault coverage can be achieved in the three steps by applying the proposed test sets. The accuracy of fault location is a single segment for a segment stuck at fault or a segment open fault, a segment pair for bridge fault.
Keywords:FPGA  fault model  fault detection  fault diagnosis  
本文献已被 CNKI 维普 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号