软错误缓解动态部分可重构的抗单粒子方案

随着基于静态随机存储器(static random-access memory,SRAM)型现场可编程门阵列(field programmable gate array,FPGA)广泛应用于航空航天领域,太空辐照环境下FPGA产生单粒子翻转(single event upset, SEU)问题的概率日益提高,从而导致FPGA出现单粒子闩锁现象引起功能紊乱。针对该问题,基于SRAM型FPGA的架构诱发SEU机理分析,对传统三模冗余(triple module redundancy, TMR)的方案进行改进,设计一种逻辑上采用TMR进行备份、系统上采用软错误算法缓解执行,同时采用局部纠错和动态可重构的方法进行抑制的方案。皮秒激光注入试验结果显示,采用所提供方案的FPGA较传统方案试验电流平稳,验证了该方案可以有效对SEU进行抑制。

Dynamic Partial Reconfiguration Project for the Anti-single Event Effect Based on the Soft Error Mitigation

With the wide application of FPGA (field programmable gate array) based on the SRAM (static random-access memory) in the aerospace field, the probability of SEU (single event upset) increases gradually while the FPGAs are exposed in irradiation environment, which may lead to the problems on single event latch-up and the disordered function. Aiming to reduce the impact of SEU, this paper presents the analysis of SEU mechanism for the SRAM style FPGA, and designs a new dynamic partial reconfiguration project based on the SEM to improve the traditional TMR (triple module redundancy). The TMR is used as a logic device for the logical backup, and the SEM is presented for the mitigation implementation. At the same time, the local error correction and the dynamic reconfiguration are employed in the system to restrain. The results based on the picosecond laser injection test show the experimental current of the proposed method is more stable than the traditional one, which confirms the validity for restraining the SEU.