| 模拟电路双重故障的单端检测 |
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| 引用本文： | 朱明英,李于凡.模拟电路双重故障的单端检测[J].华南理工大学学报(自然科学版),1999,27(1):10-13. |
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| 作者姓名： | 朱明英 李于凡 |
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| 作者单位： | 华南理工大学电子与通信工程系 |
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| 摘 要： | 模拟电路的Ｋ故障检测，初时要求测量点ｍ＝ｋ＋１，随后减至ｍ＝ｋ。本文中提出的双重故障（ｋ＝２）检测方法，只需要一个测量点（ｍ＝１）、在两个频率下进行测量，通过广义逆矩阵求解偏差方程，就可确定两个故障元件。若两个并联的阻抗元件同时发生参数偏差，方法仍然有效。
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| 关 键 词： | 模拟电路 故障诊断 故障检测 单端检测 双重故障 |
DOUBLE FAULT DETECTION AT ONE TEST POINT OF ANALOG CIRCUITS |
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| Zhu Mingying,Li Yufan.DOUBLE FAULT DETECTION AT ONE TEST POINT OF ANALOG CIRCUITS[J].Journal of South China University of Technology(Natural Science Edition),1999,27(1):10-13. |
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| Authors: | Zhu Mingying Li Yufan |
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| Abstract: | For the K fault detection of analog circuits, m=k +1 test points are required. Then the number of test points is reduced to m=k . The algorithm of double fault ( k =2) detection proposed in this paper requires only one test point,i.e. m=k -1. By measuring at two frequencies and using generalized inverse matrix to solve the deviation equations, double faults can be determine even if a faulty resistor connected with a faulty reactance component in parallel. |
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| Keywords: | analog circuit fault diagnosis testability |
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