| 颅颌骨三维测量及颅颌面畸形诊断系统的研究 |
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| 引用本文： | 武建华,王永庆.颅颌骨三维测量及颅颌面畸形诊断系统的研究[J].西安交通大学学报,1996,30(9):107-112. |
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| 作者姓名： | 武建华 王永庆 |
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| 作者单位： | 西安交通大学 |
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| 摘 要： | 文章介绍了颅颌骨三维形态的计算机辅助自动量构及测量的方法，计算出颅颌骨三维形态４部分１４５项测量项目，并能显示出可多方向观察的颅颌骨立体形态图，在此基础上，依据专家系统设计理论和方法，设计和实现了颅颌面畸形诊断专家系统ＣＭＤＳ。
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| 关 键 词： | 口腔 颅颌骨 颅颌面 畸形 诊断 专家系统 |
MEASUREMENT OF THE FINE STRUCTURE OF SEMICONDUCTOR DOPING PROFILE USING C V TECHNIQUE |
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| Sun,Zhigang,Li,Tonghe,Gao,Jie,Chen,Guangsui.MEASUREMENT OF THE FINE STRUCTURE OF SEMICONDUCTOR DOPING PROFILE USING C V TECHNIQUE[J].Journal of Xi'an Jiaotong University,1996,30(9):107-112. |
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| Authors: | Sun Zhigang Li Tonghe Gao Jie Chen Guangsui |
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| Abstract: | An improved method for the capacitance voltage measurement is presented. By this method, the fine structure of the doping profile can be measured both in the surface layer of the Si and the GaAs samples. Controlling the whole measurement process and the data analysis process by the computerized system make this new method more convenient, accurate and speedy. The hardware and software of this improved measurement system are described in detail. |
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| Keywords: | semiconductor doping profile fine scanning voltage measurement system |
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