Keggin型杂多酸H3PMo12O40对磷脂双层膜电化学行为的影响

利用循环伏安法和交流阻抗谱，以铂电极支撑的磷脂双层膜（s-BLM）作为生物膜的模型，Fe（CN）6^3-和Fe（CN）6^4-为探针分子，研究了Keggin型杂多酸H3 PMo12 O40对磷脂双层膜电化学行为的影响，结果显示s-BLM与杂多酸H3PMo12 O40之间可以发生比较强烈的相互作用，使8-BLM的通透性发生变化．这种现象的出现可能是由予在杂多酸H3PMo12O40与磷脂双层膜发生作用时引起s-BLM表面分子的排列变化，进而在膜的表面形成不可逆的微孔，而探针分子Fe（CN）6^3-/4-可以通过这些微孔接近电极，产生氧化还原响应。     

间歇模原子力显微镜扫描探针的受迫振动解

提出了一个间隙模原子力显微镜全动态工作的模型 ,用参数变换和模式展开方法 ,得到了具有粘滞阻尼和分段线性相互作用力的扫描探针的受迫弯曲振动微分方程的分析解 ,间歇模原子力显微镜扫描探针的受迫振动解 ,由接触模解和非接触模解交替工作而构成     

原子力显微镜研究糖对脂质体的稳定作用

应用原子力显微镜研究了糖类对脂质体的稳定作用,以及对形成完整磷脂双层的作用机制,获得了沉积在云母片上的干燥脂质体再水化的形貌图,证实了糖具有保持脂质体结构的功能,进一步证明了多羟基化合物有利于提高干态脂质体的物理稳定性.     

间歇模原子力显微镜扫描探针的非线性振动

提出了一个用于描述间歇模原子力显微镜扫描探针全动态工作的非线性受迫弯曲振动模型，这个模型考虑了一个附加于扫描探针上的质量和任意类型的探针－样品表面间的非线性相互作用力。用参数变换和模式展开方法求得了间歇模原子力显微镜扫描探针非线性受迫弯曲振动的解，给出了数值模拟的结果。     

碳纳米管探针对小鼠IgG蛋白的纳米表征

碳纳米管探针是原子力显微镜新一代探针,在柔软生物样品的微观形貌表征领域有重要的应用价值.研究和分析了碳纳米管原子力显微镜探针和普通硅探针对小鼠IgG蛋白形貌的表征能力.通过原子力显微镜实验对比研究发现,普通硅探针容易对IgG蛋白产生显著的压痕,而碳纳米管探针具有良好的柔韧性,能显著减小成像时对柔软的生物样品的损伤.硅探针与样品间存在较大的毛细力,会降低探针的分辨率;由于碳纳米管疏水,纳米管探针能显著减小毛细力的影响,能高分辨率地检测IgG蛋白,充分发挥纳米管探针的高分辨率优势.     

钢筋混凝土的泊松系数

文章基于接近实物尺寸的钢筋混凝土构件复合受力试验和回归分析,提出钢筋混凝土组合材料泊松系数的新概念和回归方程。钢筋混凝土组合材料泊松系数与匀质弹性材料泊松系数不同,它不是一个常数。钢筋混凝土组合材料泊松系数分为受拉泊松系数和受压泊松系数,且受拉泊松系数常为负值。受拉泊松系数回归曲线存在上升段和下降段;受压泊松系数回归曲线分为混凝土开裂前、达到峰值应力前和峰值应力后３ 个阶段。     

扫描探针显微术的应用（综述）

扫描探针显微镜（SPM）是扫描隧道显微镜（STM）,原子力显微镜（AFM）,近场光学显微镜（SNOM）等近几年发展起来的新型显微镜的总称,SPM的发展使得在纳米尺度上研究物质的特性和相互作用成为可能,它为生物,医学等传统学科提供了一个崭新的研究工具。     

磷脂形状对生物膜自组织结构的影响

采用聚合物自洽场理论研究了构成生物膜的磷脂分子的形状对含有2个跨膜蛋白的生物膜自组织结构的影响.每个磷脂分子由一条疏水的尾巴和亲水的头构成,可以看作一根接有亲水头的高分子链.由系统自由能求极小,可以得到系统的平衡态构型.结果发现,当磷脂分子具有头尾对称的柱状形状时,生物膜形成的是人们熟知的通常形态;而当磷脂分子头部比较大、整体形成锥形结构时,生物膜可以形成孔洞结构.随着2个跨膜蛋白之间距离的增加,生物膜会依次形成两孔洞、三孔洞和四孔洞.通过改变跨膜蛋白不同的疏水程度和磷脂分子头尾的体积比,构造出了生物膜结构形态的相图.这一发现对于理解蛋白质-磷脂膜的相互作用、生物膜的融合分裂以及脂质筏的形成等具有重要的意义.     

外延Pb(Zr0.2Ti0.8)O3薄膜中畴生长与所加脉冲的关系

采用柱状畴的理论模型,研究了用原子力显微镜的探针在外延Pb(Zr_0.2Ti_0.8)O₃薄膜中形成的纳米畴的生长与所加脉冲的关系。指出在PZT薄膜中畴的半径随所加脉冲的持续时间的增加以对数方式增大,随脉冲电压的增加而线性增大。理论计算与试验结果相吻合。     

AFM纳米操纵中侧向推动力的测量方法

纳米级操纵技术是制造纳米级结构、器件的重要方法之一,同时也是研究纳米粒子之间相互作用的重要手段.该文在运用原子力显微镜的探针操纵碳纳米管的同时,开发了一种纳米级操纵力的同步测量方法.应用该方法,成功测量出了操纵、切割碳纳米管的侧向力信息,从而为研究纳米粒子、基体与操纵工具之间的相互作用提供了最直接的力学信息和实验结果.在此基础上,可以进行初步的纳米设计,研究纳米新材料的力学特性.     

导电原子力显微镜在介质薄膜电流图像检测中产生的假像

对导电原子力显微镜在介质层电流图像检测中存在的假像进行了研究。发现这种假像归因于导电探针针尖较大的直径,其大小与被检测样品表面的缺陷点、漏洞、沟穴大小相关。研究表明,为提高图像分辨率,避免检测过程中存在的假像,需要使用具有纳米直径针尖的超尖导电探针。     

SPEK-C膜的正电子湮灭寿命谱学研究

利用正电子湮灭寿命谱(PALS)法及原子力显微镜(AFM)，研究了磺化及溶剂蒸发对(磺化)酚酞侧基聚芳醚硐(SPEK-C)膜制备的影响．结果表明：磺化基团的引入，降低了分子间的作用力，使得分子间排列不紧密，导致聚合物的自由体积大小与强度同时增加；铸膜液溶剂挥发，聚合物浓度增加，胶束聚集体的相互聚集产生较大的胶束聚集体孔，使自由体积减小而强度增大，聚合物的自由体积较好地反映了胶束聚集体的聚集特征．     

Molecular dynamics simulation of nanoscale contact and sliding processes for probes with different tip radius of curvature

Three-dimensional simulations were carried out molecular dynamics （MD） to study the contact and sliding processes between diamond points with different tip radius of curvature and surfaces of single crystal copper. The material deformation, abrasion mechanism, lattice defects, the force of contact process, and the sliding friction process were investigated. The simulation results show that the contact force, dislocations, and stacking fault defects, increase during the contact process with increasing contact depth or tip radius of curvature. The dislocations emit along the [10i-] and [i-01] direction and then a glide band is formed. It was also found that a greater tip radius of cur- vature results in a larger groove and more material defor- mation. The normal force and friction increase with increasing tip radius of curvature, but the coefficient of friction decreases. The stacking faults spread along the sliding direction and increase with increasing tip radius of curvature. In addition, the number of upheaval atoms increases as the radius of tip curvature or sliding distance increases.     

Elimination of bistability in constant-phase mode in atomic force microscopy

By presenting the phase properties of bistability in amplitude-modulation atomic force microscopy, we put forward a technique, the constant-phase mode, which may eliminate bistability. Using this approach, we keep the phase shift between driving and oscillation constant, slightly above -90°. In addition to the adjustment of the free amplitude, we add to amplitude-modulation atomic force microscopy another feedback so that the tip always oscillates in the high-amplitude state. A numerical simulation is carried out to demonstrate that the algorithm prevents bistability effectively.     

原子力显微镜针尖与样品间的材料转移

研究氮化硅针尖在十八烷基三甲氧基硅烷 (OTE) /云母表面的修饰过程。使用原子力 /摩擦力显微镜 ,以云母作为参考样品 ,研究了针尖在样品表面的修饰效应和修饰后针尖的清洁过程 ,并考察了湿度和载荷对针尖修饰效应的影响。修饰过程不是一个渐进的过程 ,在最初几次摩擦扫描中修饰较快 ,然后在 10～ 2 0次扫描后达到平衡态。在 OTE/云母表面修饰后的针尖在云母表面的摩擦力信号比修饰前针尖在云母表面的摩擦力信号小 ,并且大部分吸附在针尖表面的 OTE分子在云母表面的前 10次扫描中就被磨掉。相对湿度对针尖的修饰效应影响不大。在研究不同样品的摩擦性能时 ,尽量使用清洁针尖 ,并使用摩擦性能稳定的参考样品 (如云母 )来检测针尖的表面状态     

Determination of hydration film thickness using atomic force microscopy

Surface forces between particles control phenomenasuch as dispersion, agglomeration, coatings, adhesion,wetting, friction, and polishing, which play a crucial rolein materials processing. The importance of surface forcesis more appreciated especially in colloidal processing,while materials in a colloidal state are frequently preferredin industrial processing operations (e.g., printing inks,toners, paints, skin creams, blood substitutes, gels used asdrug-delivery systems, etc.) because their lar…     

Microstructure of flow pattern defects in boron-doped Czochralski-grown silicon

The morphology and microstructure of flow pattern defects （FPDs） in lightly boron-doped Czochralski-grown silicon （Cz-Si） crystals were investigated using optical microscopy and atomic force microscopy. The experimental results showed that the morphology of FPDs was parabola-like with several steps. Single-type and dual-type voids were found on the tip of FPDs and two heaves exist on the left and right sides of the void. All the results have proved that FPDs were void-type defects.     

Magnetic exchange force microscopy with atomic resolution

The ordering of neighbouring atomic magnetic moments (spins) leads to important collective phenomena such as ferromagnetism and antiferromagnetism. A full understanding of magnetism on the nanometre scale therefore calls for information on the arrangement of spins in real space and with atomic resolution. Spin-polarized scanning tunnelling microscopy accomplishes this but can probe only conducting materials. Force microscopy can be used on any sample independent of its conductivity. In particular, magnetic force microscopy is well suited to exploring ferromagnetic domain structures. However, atomic resolution cannot be achieved because data acquisition involves the sensing of long-range magnetostatic forces between tip and sample. Magnetic exchange force microscopy has been proposed for overcoming this limitation: by using an atomic force microscope with a magnetic tip, it should be possible to detect the short-range magnetic exchange force between tip and sample spins. Here we show for a prototypical antiferromagnetic insulator, the (001) surface of nickel oxide, that magnetic exchange force microscopy can indeed reveal the arrangement of both surface atoms and their spins simultaneously. In contrast with previous attempts to implement this method, we use an external magnetic field to align the magnetic polarization at the tip apex so as to optimize the interaction between tip and sample spins. This allows us to observe the direct magnetic exchange coupling between the spins of the tip atom and sample atom that are closest to each other, and thereby demonstrate the potential of magnetic exchange force microscopy for investigations of inter-spin interactions at the atomic level.     

离子匹配精细水驱提高采收率机理研究

水驱是油田开发的主要技术，但常规水驱只是通过向地层补充能量的方式提高采收率，而离子匹配水驱技术则是基于油藏介质中固-液微界面作用强的特点，通过对注入水离子类型和强度的精确离子匹配实现剥离残余油膜提高驱油效率。以西峰油田为例，结合室内驱油实验、Zeta电位测量、原子力显微分析和界面作用力数值计算等方法，系统研究了离子匹配精细水驱技术提高低渗油藏采收率的主控因素。结果表明，随着注入水离子类型的调整和离子浓度的改变，在二次采油和在三次采油模式下，离子匹配精细水驱分别比模拟地层水驱提高采出程度15.6和9.8个百分点。其中，界面的Zeta电位和分离压的大小与离子匹配精细水的离子类型关系密切。相同离子浓度情况下，数值计算与原子力显微分析实验所得结果均表明，Na⁺比Ca²⁺和Mg²⁺的分离压高，从而表现出了更有利于从岩石表面剥离油膜的能力；同时，随着注入水离子浓度的降低，盐水-原油-岩石界面的Zeta电位负值和分离压均呈增大的趋势，油和岩石表面之间的斥力增大，致使残余油更容易从岩石表面剥落，离子匹配精细水驱有助于提高水驱油藏的开发效果。     

Research on the atomic force microscopy-based fabrication of nanochannels on silicon oxide surfaces

The atomic force microscopy (AFM)-based nanomachining of nanochannels on silicon oxide surfaces is investigated both theo-retically and experimentally. The relationships of nanochannel depth versus cutting velocity, nanochannel depth versus normal force, friction force versus cutting velocity, and friction force versus normal force are systematically studied. Using the derived theory and fabrication method, a nanochannel with an expected depth can be machined simply by controlling the vertical deflection signal on the position sensitive detector of AFM. The theoretical analysis and fabrication method can be effectively used for AFM-based fabrication of nanochannels.