一种新的基于扫描线算法的DRC方法

提出一种新的基于扫描线算法的ＩＣ版图几何设计规则检查方法．根据各类设计规则检查（ＤＲＣ）命令对运算边对的要求及检查值，选择保留适当的旧扫描线及其部分矢量，建立相应的数据结构和检索策略，实现在一次扫描中同时完成ｘ、ｙ方向的检查，冗余工作大大减少．采用的算法和数据结构适宜于将数据分段处理，便于使用内、外存数据交换方式，以降低对内存的要求，适宜于检查ＶＬＳＩ版图．

New DRC Approach Based on Scan Line Algorithm

A new design rule checking approach based on scan line algorithm for IC layout was proposed. Through analyzing the operation edge pair required by each kind of DRC command, adequate old scan lins and some edges were remained in terms of the checking value. The corresponding data structure and searching strategy were used. By using this method, checkig layout in both x and y directions can be completed in one time, so the redundant work is greatly reduced. The approach and data structure are adapted to partition processing, so it is convenient to use the method of exchanging data between memory and disk. It has lower requirement for memory and can fulfill the DRC task for VLSI layout.