| 维恩滤质分析器的聚焦和象差理论 |
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| 引用本文： | 唐天同.维恩滤质分析器的聚焦和象差理论[J].西安交通大学学报,1987(3). |
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| 作者姓名： | 唐天同 |
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| 作者单位： | 西安交通大学电子工程系 |
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| 摘 要： | 本文对维恩滤质分析器(Wien filter analyzer)即交叉场分析器的电场和磁场分布特点,粒子轨迹、聚焦成象性质和象差进行了系统的理论研究;推导了分析器的二级几何象差与一级色差的一般公式,并特别研究了具有类似圆透镜聚焦性能的双向聚焦维恩滤质分析器的情形;给出了横向场具有矩形分布时一级色差系数和二级孔阑象差系数的解析公式.
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| 关 键 词： | 离子光学 维恩滤质分析器 象差 色差 |
ABERRATION ANALYSIS OF WIEN FILTER ANALYZER |
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| Tang Tiantong.ABERRATION ANALYSIS OF WIEN FILTER ANALYZER[J].Journal of Xi'an Jiaotong University,1987(3). |
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| Authors: | Tang Tiantong |
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| Institution: | Department of Electronic Engineering |
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| Abstract: | In this paper,the electrical and magnetic field expressions,focusing
and aberration properties for a crossed(E x B)field analyzer(Wien filter
analyzer)are theoretically analyzed and formulae are derived for calculating
the first-order chromatic and second-order geometrical aberrations.Special
discussion is made for the stigmatic analyzer with round lens like focusing
properties.Analytical expressions of the aberration coefficients are derived
under the assumption of rectangular field distribution approximation. |
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| Keywords: | ion optics wien filters aberration chromatic aberrations |
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