| 激光束诱导电流谱无损检测技术的应用 |
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| 引用本文： | 俞雷鸣,于海春,杨玉军,陈贵宾.激光束诱导电流谱无损检测技术的应用[J].淮阴师范学院学报(自然科学版),2006,5(3):204-207. |
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| 作者姓名： | 俞雷鸣 于海春 杨玉军 陈贵宾 |
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| 作者单位： | 1. 江苏省淮安市,质量技术监督局,江苏,淮安,223001
2. 淮阴师范学院,物理与电子学系,江苏省低维材料化学省重点建设实验室,江苏,淮安,223001 |
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| 基金项目： | 江苏省教育厅自然科学基金 |
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| 摘 要： | 高分辨率、非直接接触的激光束诱导电流谱表征手段成功用于表征HgCdTe光伏型红外探测器单元,获得了HgCdTe光伏型器件单元的几何结构信息,为HgCdTe器件的优化设计提供参考依据.
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| 关 键 词： | 激光束诱导电流谱 无损检测 p-n结 |
| 文章编号： | 1671-6876（2006）03-0204-04 |
| 收稿时间： | 2006-05-28 |
| 修稿时间： | 2006年5月28日 |
Characterizing the HgCdTe Photovoltaic Devices by Laser Beam Induced Current Technique |
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| YU Lei-ming,YU Hai-chun,YANG Yu-jun,CHEN Gui-bin.Characterizing the HgCdTe Photovoltaic Devices by Laser Beam Induced Current Technique[J].Journal of Huaiyin Teachers College(Natrual Science Edition),2006,5(3):204-207. |
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| Authors: | YU Lei-ming YU Hai-chun YANG Yu-jun CHEN Gui-bin |
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| Abstract: | A measurement system of laser beam induced current(LBIC) with high spatial-resolution and without requiring any direct electrical contact to the unit is presented.It has been widely applied to study the electrical non-uniformities at the surface of the semiconductor materials and devices.The line-scanning and mapping profiles of a series of HgCdTe p-n junctions have been demonstrated.The region of p-to-n type conversion by boron ions implantation is larger than the real implanted area. |
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| Keywords: | laser beam induced current non-destructive testing p-n junctions |
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