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用椭偏仪同时测定主应力差和方向
引用本文:徐真善. 用椭偏仪同时测定主应力差和方向[J]. 上海理工大学学报, 1985, 0(4)
作者姓名:徐真善
作者单位:上海机械学院精密仪器工程系
摘    要:本文叙述了用衡消型(NE)、旋转检偏器型(RAE)和偏振调制型(PME)椭偏仪均能同时测定光弹性试件的主应力差和方向两个量的原理,并推导了有关的计算公式。

关 键 词:偏振分析  光弹性试验

The Concurrent Determination of Principal Stresses'' Difference and Directions with Ellipsometer
Xu Zhenshan. The Concurrent Determination of Principal Stresses'' Difference and Directions with Ellipsometer[J]. Journal of University of Shanghai For Science and Technology, 1985, 0(4)
Authors:Xu Zhenshan
Affiliation:Xu Zhenshan
Abstract:Opticaly, the point measurement method of two-dimensional photoelasticity is as good as the means to determine the fast and slow axis' directions of an ideal linear retarder and their relative retardation. The measurement equation is formulated in ellipsometry is a complex equation which can be changed into two real equations. Therefore, no matter which one kind of ellipsometers is used, such as null ellipsomer, rotating-analyzer ellipsometer or polarization modulated ellipsometre, the difference and directions of the principal stresses can be measured at once by any of them.In this paper the theorem of contemporaneous determination of these two magnitudes by these three ellipsometers is described and the formula for calculation are also derived.Sinece the mini-computers have been used widely the complexity of calculation is not a problem at all.
Keywords:Polrization analysis  Photoelastie experiment
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