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基于热失效与灵敏度的故障模式分析方法
引用本文:邱文昊,黄考利,连光耀,李会杰.基于热失效与灵敏度的故障模式分析方法[J].科学技术与工程,2018,18(34).
作者姓名:邱文昊  黄考利  连光耀  李会杰
作者单位:陆军工程大学石家庄校区,陆军工程大学石家庄校区,中国人民解放军32181部队,中国人民解放军32181部队
基金项目:装备预研基金,国防预先研究科研项目
摘    要:针对测试性验证试验中现有故障模式分析方法主观性、盲目性较强以及历史数据缺乏的问题,在传统方法的基础上,提出基于热失效与灵敏度分析的改进故障模式分析方法。首先,依据现有方法的不足,明确了改进故障模式分析方法的流程;其次,建立试验对象温度场分布模型,分析温度对性能退化的影响;然后,通过识别工作中的过热区域分析由热失效造成的故障模式;最后,依据灵敏度分析结果进一步补充对试验对象功能影响较大部分的故障模式。实例应用表明,与传统方法相比,该方法在热失效分析基础上,结合功能特性分析,能够获得更加完备的潜在故障模式,有效提高了测试性验证试验样本的可信度。

关 键 词:测试性验证试验  故障模式分析  性能退化  热失效  灵敏度
收稿时间:2018/7/28 0:00:00
修稿时间:2018/9/12 0:00:00

Failure Mode Analysis Method Based on Thermal Failure and Sensitivity
Qiu Wenhao,and.Failure Mode Analysis Method Based on Thermal Failure and Sensitivity[J].Science Technology and Engineering,2018,18(34).
Authors:Qiu Wenhao  and
Institution:Shijiazhuang Campus, Army Engineering University,,,
Abstract:Considering the traditional failure mode analysis problem of higher subjectivity, stronger blindness and lacking of electronic equipment historical failure data in traditional failure mode effect and critically analysis (FMECA), based on the traditional method, an improved method of failure mode analysis on the basis of based on thermal failure and sensitivity analysis was proposed. Firstly, the process of the improved method was clarified according to the existing method. Secondly, the electronic equipment temperature distribution model was established to analysis the effect of temperature on the working environment to performance degradation. Then the heated area was identified through temperature distribution,and the failure mode that caused by thermal failure was analyzed. Finally, the failure mode which has great influence on electronic equipment function was supplemented according to the results of component sensitivity. The results of application combination show that, this method combines with thermal failure analysis and functional analysis and can obtain more complete potential failure mode, while being more applicable for testability verification test.
Keywords:testability  verification test  failure mode  analysis    performance  degradation    thermal  failure    sensitivity
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