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一种忆阻扫描触发器设计
引用本文:陈传东,魏榕山,陈群超,王仁平. 一种忆阻扫描触发器设计[J]. 福州大学学报(自然科学版), 2016, 44(2): 207-212
作者姓名:陈传东  魏榕山  陈群超  王仁平
作者单位:福州大学物理与信息工程学院,福建 福州 350116,福州大学物理与信息工程学院,福建 福州 350116,福州大学物理与信息工程学院,福建 福州 350116,福州大学物理与信息工程学院,福建 福州 350116
摘    要:基于惠普公司的忆阻器模型,提出一种可支持断电模式的选择扫描触发器电路.数据可以从主从触发器中被传输存储到忆阻器中,在触发器被断电期间,忆阻器一直保持该数据.当扫描触发器处于唤醒时刻,忆阻器所保持的数据可以被控制回传到主从触发器中.采用惠普公司提供的忆阻器模拟电路仿真模型进行仿真验证,仿真数据及波形表明,该电路可以满足集成电路的低功耗扫描测试需求.

关 键 词:扫描触发器,扫描链, 忆阻器, 低功耗, SPICE

Design of scan flip-flop based on memristor
CHEN Chuandong,WEI Rongshan,CHEN Qunchao and WANG Renping. Design of scan flip-flop based on memristor[J]. Journal of Fuzhou University(Natural Science Edition), 2016, 44(2): 207-212
Authors:CHEN Chuandong  WEI Rongshan  CHEN Qunchao  WANG Renping
Affiliation:College of Physics and Information Engineering, Fuzhou University, Fuzhou, Fujian 350116, China,College of Physics and Information Engineering, Fuzhou University, Fuzhou, Fujian 350116, China,College of Physics and Information Engineering, Fuzhou University, Fuzhou, Fujian 350116, China and College of Physics and Information Engineering, Fuzhou University, Fuzhou, Fujian 350116, China
Abstract:A variety of applications based on memristor have been explored after its successful fabricated at HP laboratory in 2008 as a fundamental electronic element. One major challenge when designing low-power CMOS integrated circuit is the lack of standard flip-flop which can support power-off mode. In this paper, we study the characteristics of memristor, a multiplexed flip-flop model based on memristor is proposed which can support power-off mode for scan testing. Data in the master-slave flip-flop can be stored into the memristor, the memristor hold the data during the time of total memristive multiplexed flip-flop is cut off from the power line. At the wake up time, data in the memristor can be recalled back to the master-slave flip-flop. Signal waveforms of the simulation results show that the presented memristive multiplexed flip-flop meet the requirements for low-power scan testing.
Keywords:Multiplexed Flip-Flop   Scan Testing   Memristor   Low-Power   SPICE
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