| A research on high-temperature permittivity and loss tangent of low-loss dielectric by resonant-cavity technique |
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| 作者姓名： | 曹茂盛 Hou Zhiling Shi Xiaoling Wang Fuchi |
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| 作者单位： | [1]School of Material Science and Engineering, Beijing Institute of Technology, Beijing 100081, P.R. China [2]School of Science, Beijing University of Chemical Technology, Beijing 100029, P.R. China |
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| 基金项目： | 国家重点基础研究发展计划(973计划)
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国家重点基础研究发展计划(973计划)
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国防基金 |
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| 摘 要： | Resonant-cavity technique was introduced to measure the permittivity and loss tangent of low-loss dielectrics. The dielectric properties at 9-10 GHz are measured accurately at the temperature up to 800 ℃ by the resonant cavity technique. The only electrical parameters that need to be measured are quality factors （Q） and resonant length （L） of resonant cavity loaded and unloaded with dielectric sample. Moreover, the error caused by thermal expansion effect was resolved by error analysis and experimental calibration.
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| 关 键 词： | 高温 谐振腔 电容率 误差校正 |
| 修稿时间： | 2006-06-18 |
A research on high-temperature permittivity and loss tangent of low-loss dielectric by resonant-cavity technique |
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| Cao Maosheng,Hou Zhiling,Shi Xiaoling,Wang Fuchi.A research on high-temperature permittivity and loss tangent of low-loss dielectric by resonant-cavity technique[J].High Technology Letters,2007,13(3):279-282. |
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| Authors: | Cao Maosheng Hou Zhiling Shi Xiaoling Wang Fuchi |
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| Institution: | 1. School of Material Science and Engineering, Beijing Institute of Technology, Beijing 100081, P.R. China
2. School of Material Science and Engineering, Beijing Institute of Technology, Beijing 100081, P.R. China;School of Science, Beijing University of Chemical Technology, Beijing 100029, P.R.China |
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| Abstract: | Resonant-cavity technique was introduced to measure the permittivity and loss tangent of low-loss dielectrics. The dielectric properties at 9-10 GHz are measured accurately at the temperature up to 800 ℃by the resonant cavity technique. The only electrical parameters that need to be measured are quality factors (Q) and resonant length (L) of resonant cavity loaded and unloaded with dielectric sample. Moreover, the error caused by thermal expansion effect was resolved by error analysis and experimental calibration. |
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| Keywords: | high temperature resonant cavity method permittivity errors calibration |
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