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Fault Tree Analysis of a Launching with Binary Decision Diagram Method and Fuzzy Theory
Abstract:Fault tree analysis(FTA),as a structurally simple,visualized and scientific method,is widely used in various fields.To complete the FTA of the launching device,the binary decision diagram(BDD)method is used to obtain the non-intersect cut sets,the minimum cut sets and the probability importance of components.Then,the expert evaluation method is applied to solving fuzzy probability rate of bottom event with zero failure data.In this paper,the BDD and expert evaluation method are applied into FTA to analyze a launch device.
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