| 利用双波长光源测量透明膜的厚度 |
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| 引用本文： | 周佩瑶,徐玉兰.利用双波长光源测量透明膜的厚度[J].首都师范大学学报(自然科学版),2001,22(4):23-25. |
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| 作者姓名： | 周佩瑶 徐玉兰 |
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| 作者单位： | 1. 天津大学物理系
2. 首都师范大学物理系 |
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| 摘 要： | 介绍了用双波长测量透明膜厚度的原理及方法，并人出了实验结果。
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| 关 键 词： | 双波长光源 干涉仪 薄膜 光程差 钛宝石激光器 厚度测量 测量原理 测量方法 |
| 修稿时间： | 2001年6月7日 |
Applications of Double-Wavelength Light Source on measurement of Thickness of thin-film. |
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| Zhou Peiyao.Applications of Double-Wavelength Light Source on measurement of Thickness of thin-film.[J].Journal of Capital Normal University(Natural Science Edition),2001,22(4):23-25. |
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| Authors: | Zhou Peiyao |
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| Institution: | Zhou Peiyao(Tianjin University) Xu Yulan(Capilal Normal University) |
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| Abstract: | The principle and method that measure the thickness of thin\|film by using double wavelength light source(laser) are discussed. Several experimental results are also presented. This method offers a new applied field for double wavelength lasers. |
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| Keywords: | Double wavelength Interferometer Laser Thin film Ti sapphire |
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