| 电子元器件的失效模式、周期与可靠性 |
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| 引用本文： | 门赫.电子元器件的失效模式、周期与可靠性[J].镇江高专学报,2006,19(2):68-70. |
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| 作者姓名： | 门赫 |
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| 作者单位： | 镇江市高等专科学校,电子与信息系,江苏,镇江,212003 |
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| 摘 要： | 电子元器件的失效是引发电路或系统故障的主要因素，虽然电子元器件的失效模式多种多样，但它们的失效周期却是一定的规律性。可靠性指标是电子元器件的重要质量指标之一，是电子电路系统可靠性的基础。
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| 关 键 词： | 元器件 失效模式、周期 可靠性 |
| 文章编号： | 1008-8148(2006)02-0068-03 |
| 收稿时间： | 02 28 2005 12:00AM |
| 修稿时间： | 2005年2月28日 |
On the mode and cycle of invalidation of electronic components and their reliability |
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| MEN He.On the mode and cycle of invalidation of electronic components and their reliability[J].Journal of Zhenjiang College,2006,19(2):68-70. |
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| Authors: | MEN He |
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| Abstract: | The invalidation of electronic components is the main cause of circuit or system breakdown. Although there are various modes , the cycles of invalidation are regular. Quota of reliability is one of the most important quotas and is also the base the reliability of electronic and circuit system. |
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| Keywords: | components mode and cycle of invalidation reliability |
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