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X射线衍射强度公式的修正
引用本文:巴诺,高海欣,刘晓静,吴向尧,张玉梅,张斯淇,王婧,郭义庆. X射线衍射强度公式的修正[J]. 吉首大学学报(自然科学版), 2012, 33(1): 41-45. DOI: 10.3969/j.issn.1007-2985.2012.01.011
作者姓名:巴诺  高海欣  刘晓静  吴向尧  张玉梅  张斯淇  王婧  郭义庆
作者单位:(1.吉林师范大学物理学院,吉林 四平 136000;2.中国科学院高能物理所,北京 100049)
基金项目:吉林省教育厅科学研究资助项目
摘    要:X射线衍射技术在物相分析、点阵参数测量以及微应力的测定等方面被广泛应用,为了更精确地确定物理参数,X射线衍射强度的精确计算是十分重要的.目前单晶X射线衍射的强度公式的理论计算结果与实验数据有较大偏差.对衍射强度公式进行合理修正,使计算结果得到较大改善,并与实验测量的数据符合得更好.

关 键 词:X射线衍射  晶体结构  修正  

The Modified of the X-Ray Diffraction Intensity Formula
BA Nuo,GAO Hai-xin,LIU Xiao-jing,WU Xiang-yao,ZHANG Yu-mei,ZHANG Si-qi,WANG Jing,GUO Yi-qing. The Modified of the X-Ray Diffraction Intensity Formula[J]. Journal of Jishou University(Natural Science Edition), 2012, 33(1): 41-45. DOI: 10.3969/j.issn.1007-2985.2012.01.011
Authors:BA Nuo  GAO Hai-xin  LIU Xiao-jing  WU Xiang-yao  ZHANG Yu-mei  ZHANG Si-qi  WANG Jing  GUO Yi-qing
Affiliation:(1.Institute of Physics,Jilin Normal University,Siping 136000,Jilin China;2.Institute of High Energy Physics,Chinese Academy of Sciences,Beijing100049)
Abstract:The X-ray diffraction technology has been widely applied in phase identification,the determination of lattice parameters and the testing of the microstress.In order to precisely determine the physical parameters,the calculation of the X-ray diffraction intensity is very important.At present,comparedg with the experimental data,the theoretical results of the X-ray diffraction intensity formula have a large deviation.In this paper,the X-ray diffraction intensity formula has been modified reasonably and the improved results of the theoretical are in good accordance with the experimental data.
Keywords:the X-ray diffraction  crystal structure  revise
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