| Testing Cross-Talk Induced Delay Faults in Digital Circuit Based on Transient Current Analysis |
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| 作者姓名： | WANG Youren DENG Xiaoqian CUI Jiang YAO Rui ZHANG Zhai |
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| 作者单位： | College of Automation Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing 210016, Jiangsu, China |
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| 基金项目： | Supported by the National Natural Science Foundation of China （60374008, 60501022） |
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| 摘 要： | The delay fault induced by cross-talk effect is one of the difficult problems in the fault diagnosis of digital circuit. An intelligent fault diagnosis based on IDDT testing and support vector machines （SVM） classifier was proposed in this paper. Firstly, the fault model induced by cross-talk effect and the IDDT testing method were analyzed, and then a delay fault localization method based on SVM was presented. The fault features of the sampled signals were extracted by wavelet packet decomposition and served as input parameters of SVM classifier to classify the different fault types. The simulation results illustrate that the method presented is accurate and effective, reaches a high diagnosis rate above 95%.
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| 关 键 词： | 延迟故障 故障定位 数字电路 IDDT SVM |
| 文章编号： | 1007-1202（2006）06-1445-04 |
| 收稿时间： | 2006-03-20 |
Testing cross-talk induced delay faults in digital circuit based on transient current analysis |
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| WANG Youren DENG Xiaoqian CUI Jiang YAO Rui ZHANG Zhai.Testing Cross-Talk Induced Delay Faults in Digital Circuit Based on Transient Current Analysis[J].Wuhan University Journal of Natural Sciences,2006,11(6):1445-1448. |
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| Authors: | Wang Youren Deng Xiaogian Cui Jiang Yao Rui Zhang Zhai |
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| Institution: | (1) College of Automation Engineering, Nanjing University of Aeronautics and Astronautics, 210016 Nanjing, Jiangsu, China |
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| Abstract: | The delay fault induced by cross-talk effect is one of the difficult problems in the fault diagnosis of digital circuit. An intelligent fault diagnosis based on IDDT testing and support vector machines (SVM) classifier was proposed in this paper. Firstly, the fault model induced by cross-talk effect and the IDDT testing method were analyzed, and then a delay fault localization method based on SVM was presented. The fault features of the sampled signals were extracted by wavelet packet decomposition and served as input parameters of SVM classifier to classify the different fault types. The simulation results illustrate that the method presented is accurate and effective, reaches a high diagnosis rate above 95%. |
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| Keywords: | delay fault cross-talk fault localization digital circuit IDDT SVM |
| 本文献已被 CNKI 维普 SpringerLink 等数据库收录！ |
