| 透射电子显微镜像差的简化分析 |
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| 引用本文： | 魏功祥,万云芳. 透射电子显微镜像差的简化分析[J]. 山东理工大学学报：自然科学版, 2005, 19(4): 56-61 |
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| 作者姓名： | 魏功祥 万云芳 |
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| 作者单位： | 山东理工大学物理学院,山东淄博255049 |
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| 摘 要： | 通过对透射电子显微镜像差的简化分析，得到在透射电子显微过程中最佳离焦量的选择原理，并进一步讨论了消除像差影响的方法，给电子透射显微像的数字模拟提供了较简便的处理方法．
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| 关 键 词： | 像差 球差 离焦量 |
| 文章编号： | 1672-6197(2005)04-0056-06 |
| 收稿时间： | 2004-12-08 |
| 修稿时间： | 2004-12-08 |
The simplified analysis of the aberration of the transmission Electron Microscope |
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| WEI Gong-xiang,WAN Yun-fang. The simplified analysis of the aberration of the transmission Electron Microscope[J]. Journal of Shandong University of Technology:Science and Technology, 2005, 19(4): 56-61 |
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| Authors: | WEI Gong-xiang WAN Yun-fang |
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| Abstract: | Based on the simplified analysis of the aberration of the transmission electronic microscope, the principle of selecting optimum defocus in the image is carried. Furthermore, the method of eliminating the aberration is discussed which is simply used in the digital simulation of transmission electronic microcopy. |
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| Keywords: | aberration spherical defocus optimum defocus |
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