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基于两维压缩特征字分析的BIST性能分析
引用本文:蔡晨曦,王秀坛,彭应宁.基于两维压缩特征字分析的BIST性能分析[J].系统工程与电子技术,2001,23(9):1-4.
作者姓名:蔡晨曦  王秀坛  彭应宁
作者单位:清华大学电子工程系,北京,100084
摘    要:在现代电子系统的设计过程中,由于对系统的可靠性和可维护性要求越来越高,因此必须针对具体情况设计相应的内建自检(built-in self-testing,BIST)模块,从而保证系统能够进行准确的故障检测和故障定位与隔离.提出了一种基于两维压缩特征字分析的BIST方法,就其压缩原理和检测性能进行了详细分析.分析结果表明,通过时域和空域的两维压缩,可以用较短的特征字实现高故障覆盖率.该方法简单可靠,便于硬件实现.

关 键 词:信号处理  自检验  特征分析  故障安全设计
文章编号:1001-506X(2001)09-0001-04
修稿时间:2000年9月6日

Performance Analysis of Built - in Self- Testing Based on 2 - Dimensional - Compressed SignatureAnalysis
CAI Chen?xi,WANG Xiu?tan,PENG Ying?ning.Performance Analysis of Built - in Self- Testing Based on 2 - Dimensional - Compressed SignatureAnalysis[J].System Engineering and Electronics,2001,23(9):1-4.
Authors:CAI Chen?xi  WANG Xiu?tan  PENG Ying?ning
Abstract:The designing process of modern electronic systems demands high system reliability and maintainability. In order to perform fault detection, localization and isolation effectively, it is necessary to design a BIST (built-in self-testing) module specific for the system. This paper presents a BIST method based on 2-dimensional-compressed signature analysis. The principle of compression and performance of test are discussed in detail. With a short signature compressed 2-dimentionally both in time domain and space domain, this method can achieve a high faulty coverage ratio. Theoretical analysis shows that this method is reliable and easy to be implemented in hardware.
Keywords:Signal processing  Self checking  Signature analysis  Fault safety design
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