| 电荷耦合器件（CCD）在单缝衍射光强分布测量中的应用 |
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| 引用本文： | 李如璧,周根元,眭永兴.电荷耦合器件（CCD）在单缝衍射光强分布测量中的应用[J].江苏技术师范学院学报,2005,11(4):1-7. |
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| 作者姓名： | 李如璧 周根元 眭永兴 |
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| 作者单位： | [1]江苏技术师范学院基础课部,江苏常州213001 [2]江苏技术师范学院信息与教育技术中心,江苏常州213001 |
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| 摘 要： | 通过CCD传感技术把光学量--单缝衍射光强转化为电学模拟量,继而进行模数转换,最后用单片机系统进行数据处理,降低光学量测量的工作强度,获得较高的实验精度,取得较好的实验效果.
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| 关 键 词： | 电荷耦合器件（CCD） 模数转换 单片机 单缝衍射光强分布 |
| 收稿时间： | 2005-04-06 |
| 修稿时间： | 2005年4月6日 |
The Spectral Detection in Single Slit Diffraction by the Charge Coupled Device |
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| LI Ru-bi,ZHOU Gen-yuan, SUI Yong-xing.The Spectral Detection in Single Slit Diffraction by the Charge Coupled Device[J].Journal of Jiangsu Teachers University of Technology,2005,11(4):1-7. |
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| Authors: | LI Ru-bi ZHOU Gen-yuan SUI Yong-xing |
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| Institution: | 1.Department of Basic Courses, Jiangsu Teachers University of Technology, Changzhou 213001, China; 2.Information and Educating Technology Center, Jiangsu Teachers University of Technology, Changzhou 213001, China |
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| Abstract: | The determination of light intensity distributing in single slit diffraction has been completed by the CCD sense technology. It translates optical into electrical quantum and converts modulus, then processes data by SCM system to reduce the work intensity of using optical quantum measurement and obtain higher experimental precision and better experimental results. |
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| Keywords: | charger coupled device(CCD) modulus converting single chip single slit diffraction spectral detection |
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