| 一种新的LSI/VLSI电路测试方法 |
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| 引用本文： | 高建华.一种新的LSI/VLSI电路测试方法[J].东华大学学报(自然科学版),1995(1). |
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| 作者姓名： | 高建华 |
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| 作者单位： | 中国纺织大学计算机科学与工程系系统结构教研室 |
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| 摘 要： | 本文提出一种根据输出端值的变化频度测试LSI/VLSI电路I/O线上的固定故障的方法。该方法的优点是不需待测电路功能函数,也不需标准电路作比较。文章同时讨论用软件和硬件的实现方法。
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| 关 键 词： | 故障诊断 频率 逻辑设计 固定故障 输入输出线 |
A NEW TESTING APPROACH TO LSI/VLSI CIRCUITS |
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| Gao Jianhua.A NEW TESTING APPROACH TO LSI/VLSI CIRCUITS[J].Journal of Donghua University,1995(1). |
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| Authors: | Gao Jianhua |
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| Institution: | Department of Computer Science & Engineering |
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| Abstract: | Based on testing the altering frequency of output values, a high efficient approach is presented in this paper to detect stuck-at faults on I / O linesof LSI / VLSI chips. It is interesting that the approach performed in this way works efficiently without knowing the detailed implementation of circuits under testing. The method of designing the testers is also discussed in this paper. |
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| Keywords: | fault diagnosis frequency logical design stuck-at faults input-output lines |
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