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确定相薄片偏振参量的椭偏仪法研究
引用本文:赵红.确定相薄片偏振参量的椭偏仪法研究[J].西南师范大学学报(自然科学版),2009,34(6).
作者姓名:赵红
作者单位:重庆文理学院,物理与信息工程系,重庆,永川,402160
摘    要:对彼比科夫(ЪHδHKOB)提出的测量相薄片的相移和透射光相对振辐系数的椭偏仪法作了改进,论述了该改进方法依据的理论,采用的步骤;并用此方法测量了云母片的相移和透射光相对振辐系数等偏振参量.结果表明:该方法不需要复杂的专门设备,方法简单,精确度高,为非破坏性测量.

关 键 词:椭偏仪法  偏振参量  相薄片  补偿片  云母片

Study on Ellipsometry in Confirming Polarization Parameters of Phase Slice
ZHAO Hong.Study on Ellipsometry in Confirming Polarization Parameters of Phase Slice[J].Journal of Southwest China Normal University(Natural Science),2009,34(6).
Authors:ZHAO Hong
Abstract:Based on BHSHKOB's ellipsometry,a distinct method is introduced to improve the ellipsometry to measure phase displacement and diascoptic lighting's relative amplitude coefficient of phase slice.In this article,it shows the theory and process of the method.The improved method is adopted to measure such polarization parameters as the phase displacement and diascoptic lighting's relative amplitude coefficient of mica sheet.The result indicates that the improved method is a non-destructive measurement without any specific instruments.It is easily executed and precisely accurate.
Keywords:ellipsometry  polarization parameters  phase slice  compensating plate  mica sheet
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