| 基于光线跟踪的一般辐射度方法研究 |
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| 引用本文： | 袁慧.基于光线跟踪的一般辐射度方法研究[J].四川理工学院学报(自然科学版),1998(Z1). |
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| 作者姓名： | 袁慧 |
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| 作者单位： | 四川轻化工学院电子工程系!自贡，643033 |
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| 摘 要： | 通过对目前主要采用的两种真实感图形绘制技术—光线跟踪技术和辐射度方法的研究；在将光线跟踪技术和辐射度方法相结合，更有效地模拟光能在物体表面间的镜面反射、透射和漫反射光照效应方面，本文做了较深入的讨论；对非理想漫射的一般环境，给出了基于光线跟踪的一般辐射度方法及其逐步求精选代的算法。
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| 关 键 词： | 光线跟踪 辐射度 逐步求精法 两步法 |
GENERAL METHODOLOGY STUDY OF RADIOSITY BASED ON RAY TRACING |
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| Yuan Hui.GENERAL METHODOLOGY STUDY OF RADIOSITY BASED ON RAY TRACING[J].Journal of Sichuan University of Science & Engineering:Natural Science Editton,1998(Z1). |
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| Authors: | Yuan Hui |
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| Abstract: | By a study of two real image graphics rendering- ray tracing and radiosity methods,it is done for a detailed exploration in the combination of ray tracing technique and radiosity method and in the respect of simulating more effectively the reflect radiation,refract radiation and radiographed illumination models when light energy is on the surface of objects. To get a general environment of radiograph it is not so ideal. A general radiosity method based on ray tracing and a progressive refinement approach are given. |
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| Keywords: | ray tracing radiosity progressive refinement approach two pass way |
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