| 复杂设备BIT系统几种典型虚警的数学分析 |
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| 引用本文： | 徐永成,温熙森,易晓山.复杂设备BIT系统几种典型虚警的数学分析[J].系统工程与电子技术,2001,23(12):8-11. |
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| 作者姓名： | 徐永成 温熙森 易晓山 |
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| 作者单位： | 国防科大机械电子工程与仪器系, |
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| 基金项目： | 国家部委项目基金资助课题 |
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| 摘 要： | 机内测试(Built-in Test,BIT)技术是改善系统或设备测试性和诊断能力的重要途径,它能够提高设备内部检测和隔离故障的能力、简化设备维修、降低全寿命周期费用,但是较高的虚警率一直是阻碍BIT广泛应用的一个重要原因.在对复杂设备BIT系统建立数学模型的基础上,分析了BIT系统几种常见虚警的机理模式,并以此提出了相应的技术解决路线,这对BIT系统的故障诊断设计具有参考价值.
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| 关 键 词： | 测试技术 故障诊断 数学模型 虚警概率 |
| 文章编号： | 1001-506X(2001)12-0008-04 |
| 修稿时间： | 2001年2月25日 |
Mathematical Analysis of Several Typical False Alarm in the Built-in Test System of Complex Equipment |
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| XU Yong cheng,WEN Xi sen,YI Xiao shan.Mathematical Analysis of Several Typical False Alarm in the Built-in Test System of Complex Equipment[J].System Engineering and Electronics,2001,23(12):8-11. |
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| Authors: | XU Yong cheng WEN Xi sen YI Xiao shan |
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| Abstract: | The BIT (built-in test) technique is an important approach to improve testability and diagnostic capability of system or device. It can improve the inner capability of detecting and isolating fault, simplify their maintenance, and decrease their life cycle cost. But the high false alarm rate is one of important factors that prevent BIT from more application. Based on the mathematical model of complex equipment's BIT system, several usual false alarm models are analyzed and the corresponding technical line are presented. The research result has reference value for the fault diagnosis design of the BIT system. |
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| Keywords: | Measuring technique Fault diagnosis Mathematical model False alarm prability |
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