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The L-shell ionization of Ho and Os induced by electron impact
作者姓名:WU  Zhangwen  GOU  Chengjun  YANG  Dailun  PENG  Xiufeng  HE  Fuqing  LUO  Zhengming
作者单位:Key Laboratory for Radiation Physics and Technology of the Education Ministry of China; Institute of Nuclear Science and Technology, Sichuan University, Chengdu 610064, China
基金项目:Acknowledgements This work was supported by the International Atomic Energy Agency (IAEA) under Contract No. 12354/R1 and China Research Association on Atomic and Molecular Data.
摘    要:The atomic inner-shell ionization cross section in- duced by electron impact is a basic topic in atomic physics and radiation physics. Since the 1930s, a great number of experimental and theoretical studies have been done1―6]. In basic research, it is a…

关 键 词:    电子冲击  电离  X射线
收稿时间:2006-01-13
修稿时间:2006-01-132006-01-25

The L-shell ionization of Ho and Os induced by electron impact
WU Zhangwen GOU Chengjun YANG Dailun PENG Xiufeng HE Fuqing LUO Zhengming.The L-shell ionization of Ho and Os induced by electron impact[J].Chinese Science Bulletin,2006,51(16):1929-1933.
Authors:Zhangwen Wu  Chengjun Gou  Dailun Yang  Xiufeng Peng  Fuqing He  Zhengming Luo
Institution:(1) Key Laboratory for Radiation Physics and Technology of the Education Ministry of China, China;(2) Institute of Nuclear Science and Technology, Sichuan University, Chengdu, 610064, China
Abstract:The electron-induced L-shell X-ray par- tial production cross sections, total production cross sections and mean ionization cross sections for Ho and Os have been measured as functions of electron energies from near threshold up to 36 keV by using a thin target with thick substrate technique. The influ- ence of the electrons reflected from the substrate was corrected by using the electron transport biparti- tion model. Also, the corrected measured results were compared with theoretical predictions proposed by Gryzinski and McGuire.
Keywords:holmium  osmium  L-shell ionization  electron impact  
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