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贝叶斯框架支持向量机的模拟电路故障诊断
引用本文:罗志勇,史忠科.贝叶斯框架支持向量机的模拟电路故障诊断[J].系统仿真学报,2007,19(13):3009-3013.
作者姓名:罗志勇  史忠科
作者单位:1. 重庆邮电大学自动化学院,重庆,400065;西北工业大学自动化学院,陕西,西安,710072
2. 西北工业大学自动化学院,陕西,西安,710072
摘    要:基于贝叶斯证据框架下的最小二乘小波支持向量机,设计了一种新型模拟电路故障诊断方法。将贝叶斯证据框架应用于多类LS-WSVM分类器来选取正规化参数和核参数,并采用小波提升变换对从测试点得到的各种故障状态下输出电压信号进行分解获取多尺度的小波系数,对经处理的小波系数提取出故障特征量,以此作为样本训练多类LS-WSVM分类器来确定模拟电路故障诊断的模型。采用雷达系统模拟电路进行了仿真,结果表明,设计的模拟电路的故障诊断方法效果良好。

关 键 词:支持向量机  贝叶斯证据框架  小波提升变换  模拟电路  故障诊断
文章编号:1004-731X(2007)13-3009-05
收稿时间:2006-05-26
修稿时间:2006-05-262007-04-20

Fault Diagnosis for Analog Circuits Using SVM Within Bayesian Framework
LUO Zhi-yong,SHI Zhong-ke.Fault Diagnosis for Analog Circuits Using SVM Within Bayesian Framework[J].Journal of System Simulation,2007,19(13):3009-3013.
Authors:LUO Zhi-yong  SHI Zhong-ke
Institution:1. School of Automation, Chongqing University of Posts and Telecommunications, Chongqing 400065, China; 2. School of Automation, Northwestern Polytechnical University, Xian 710072, China
Abstract:Based on least squares wavelet support vector machines (LS-WSVM) within the Bayesian evidence framework, a systematic method for fault diagnosis of analog circuits was proposed. The Bayesian evidence framework was applied to select the optimal values of the regularization and kernel parameters of multi-class LS-WSVM classifiers. Also output voltage signals under faulty conditions were obtained from analog circuits test points. Then wavelet coefficients of output voltage signals were gained by wavelet lifting decomposition, and faulty feature vectors were extracted from the coefficients. The faulty feature vectors were used to train the multi-class LS-WSVM classifiers, so the model of the circuit fault diagnosis system was built. The simulation result of scout radar shows that the fault diagnosis method of the analog circuits using LS-WSVM within the Bayesian evidence framework is effective.
Keywords:support vector machines  Bayesian evidence framework  wavelet lifting transform  analog circuits  fault diagnosis
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