首页 | 本学科首页   官方微博 | 高级检索  
     

The Application of FDTD and Micro Genetic Algorithms on the Planar Spiral Inductors
引用本文:Wang Hongjian,Li Jing,Liu Heguang,Jiang Jingshan. The Application of FDTD and Micro Genetic Algorithms on the Planar Spiral Inductors[J]. 中国工程科学, 2005, 3(3): 63-66
作者姓名:Wang Hongjian  Li Jing  Liu Heguang  Jiang Jingshan
作者单位:National Microwave Remote Sensing Lab. , Center for Spac Science And Applied Research, Chinese Academy of Sciences, Beijing 100080
摘    要:1Introduction Printedcircuitsandplanarstructurehavebeenusedwidely intherecentyears.TheRFintegratecircuitbasedonCMOS andBi CMOShasmanyadvantagesoverthosebasedonthe GaAs.AlthoughlargerlossalongwiththeSi based semiconductor,thelowcostandtheeasyintegrationwiththe digitalsignalprocessor.Theadvantagesofthewireless telecommucationsuchaslostcost,lownoise,lowdissipation andhighworkingfrequencycanberealisedbyinductors,thereforethedesignoftheinductorsareofgreatimportance forthewholestructure.Theind…

关 键 词:FDTD 遗传算法 平面螺旋感应器 工作原理 品质因数
收稿时间:2004-11-29

The Application of FDTD and Micro Genetic Algorithms on the Planar Spiral Inductors
Wang Hongjian,Li Jing,Liu Heguang,Jiang Jingshan. The Application of FDTD and Micro Genetic Algorithms on the Planar Spiral Inductors[J]. Engineering Sciences, 2005, 3(3): 63-66
Authors:Wang Hongjian  Li Jing  Liu Heguang  Jiang Jingshan
Affiliation:(National Microwave Remote Sensing Lab., Center for Space Science And Applied Research,Chinese Academy of Sciences, Beijing 100080)
Abstract:High Q inductors are the important elements for RF circuit design. In this paper, the FDTD method is applied to explain the crowding effect of the spiral inductor , which can never be accurately analyzed by analytical solutions. The experimental results verify the FDTD simulation. The micro genetic algorithms and FDTD are combined to design the high Q of the inductor, the results show the efficiency of this exploration.
Keywords:FDTD  genetic algorithms(GA)  spiral inductor  quality factor
本文献已被 CNKI 维普 等数据库收录!
点击此处可从《中国工程科学》浏览原始摘要信息
点击此处可从《中国工程科学》下载全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号