| 微处理器的功能测试及诊断方法的实验评价 |
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| 引用本文： | 黄建文.微处理器的功能测试及诊断方法的实验评价[J].江苏大学学报(自然科学版),1991(3). |
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| 作者姓名： | 黄建文 |
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| 摘 要： | 数字系统,特别是微处理器的检测和诊断的理论及实验技术发展很快。文章阐述作者在访法期间,与同事们合作,对各种典型测试方法的实验评价结果.其中随机法的测试错误复盖率高,给人以深刻的印象.
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| 关 键 词： | 功能测试 错误复盖率 随机测试 确定性测试 |
Experimental Evaluation of Test and Diagnosis of Microprocessors |
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| Huang Jianwen.Experimental Evaluation of Test and Diagnosis of Microprocessors[J].Journal of Jiangsu University:Natural Science Edition,1991(3). |
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| Authors: | Huang Jianwen |
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| Institution: | Huang Jianwen |
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| Abstract: | The theory and technique of the test and diagnosis for the digital system, especically for the microprocessors, are developing very rapidly. This paper introduces the results of experimental evaluation of the different kinds of testing methods, which were done by the author and his colleagues in France. The random test seems to achieve a higher "faulty circuit coverage". |
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| Keywords: | functional test faulty circuit coverage random test determinate test |
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