序列凸化下的电路DCTT统计最优化方法

基于集成电路成品率极大中心设计,最佳容差设计,最佳调整设计和生产费用极小化设计的一体化模型(DCTT模型),该文给出了函数序列凸化下求解DCTT的有效方法。该方法应用确定性方法和正交最优化方法相结合,将容差域的2ⁿ个顶点离散为n+1个约束条件,并利用不可微规划直接得到DCTT问题的最优解。该方法较好地解决了较大规模的集成电路统计最优化问题。

CIRCUIT STATISTICAL OPTIMIZATION TECHNIQUE UNDER SEQUENTIAL CONVEXITY OF FUNCTIONS

Based on the unitized model of design centering for maximum manufacturing yield,optimal toleraneing design, optimal tuning design and design of minimized manufacturing costs of integration,an efficient method of solving DCTT is given under the conditions of sequential convexity of functions in this paper. The method combines the deterministic optimization technique with the orthogonal optimal experiment method to change the 2ⁿ vertices of the tolerance region into (n+1) constraint conditions,and uses nondifferentiable optimization to solve the DCTT problem directly. Therefore,the method can solve large scale IC statistical optimization problems.