| 微波集成电路基片复介电常数的无损测量 |
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| 引用本文： | 李纪鹏,蔡树臻.微波集成电路基片复介电常数的无损测量[J].复旦学报(自然科学版),1998,37(6):776-781. |
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| 作者姓名： | 李纪鹏 蔡树臻 |
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| 作者单位： | 复旦大学波散射与遥感中心!上海，200435 |
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| 摘 要： | 提出了一种测量微波集成电路基片复介电常数的新方法。通过测量贴于开口矩形波导外的介质基片的等效导纳值，可计算得到基片的介电常数和损耗角。经过理论分析，给出了修正的导纳计算公式和求解复介电常数的优化算法。
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| 关 键 词： | 微波集成电路 介电常数 开口波导 无损测量 |
Microwave Nondestructive Examination of Dielectric Constants of Substrates |
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| Li Jipeng,Cai Shuzhen.Microwave Nondestructive Examination of Dielectric Constants of Substrates[J].Journal of Fudan University(Natural Science),1998,37(6):776-781. |
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| Authors: | Li Jipeng Cai Shuzhen |
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| Abstract: | A novel method for dielectric constant measurement of substrates of microwave integrated circuits is presented. The sample is attached to the surface of an open-ended rectangular waveguide,the complex permitivity is evaluated from the aperture admittance of this flange mounted waveguide. The revised formula for computing admittance and the optimizing method for solving the related equation are presented. The apparatus for the measurement is also described. The results show that this method is very simple,accurate,and nondestructive. |
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| Keywords: | microwave integrated circuit dielectric constant open-ended waveguide nondestructive examination |
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