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基于单片机数字集成电路参数测试仪的设计
引用本文:施养智.基于单片机数字集成电路参数测试仪的设计[J].漳州师院学报,2009(1):44-47.
作者姓名:施养智
作者单位:漳州师范学院物理与电子信息工程系,福建漳州363000
摘    要:本系统以PIC16F73为核心,利用A/D及D/A转换实现对数字集成门电路7404主要特性参数的全自动测定,同时还可通过双踪示波器直观地显示门电路的电压传输特性曲线,利用两片数字电位器可实现门电路的输入负载特性曲线.

关 键 词:PIC16F73  D采集  D/A转换  参数测量  特性曲线

Designed of Numerical Integrated Circuit Parameter Test Instrument Base on MCU
SHI Yang-zhi.Designed of Numerical Integrated Circuit Parameter Test Instrument Base on MCU[J].Journal of ZhangZhou Teachers College(Philosophy & Social Sciences),2009(1):44-47.
Authors:SHI Yang-zhi
Institution:SHI Yang-zhi (Department of Physics and Electronic Information Engineering, Zhangzhou Normal University, Zhangzhou, Fujian 363000, China)
Abstract:This system takes the PICi6 F73 as core, making use of A/D and D/A's conversion to carry out the full-automatic measurement that the logarithms character set becomes a door electric circuit 7404 main characteristic parameters, can also show the electric voltage that a machine keeps view ground a manifestation door electric circuit to deliver characteristic curve through two channel oscilloscope in the meantime, making use of two slices of nnmerical electric potential machines can carry, out an electric circuit of importation load characteristic curve.
Keywords:PIC16F73  A/D  D/A  parameter measurement  characteristic curve
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