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基于CPLD的线阵CCD尺寸测量系统研究
引用本文:秦旭磊,孙振路,陆学飞. 基于CPLD的线阵CCD尺寸测量系统研究[J]. 河北省科学院学报, 2011, 28(4): 7-9,21
作者姓名:秦旭磊  孙振路  陆学飞
作者单位:1. 长春理工大学,吉林长春,130022
2. 河北省科学院激光研究所,河北石家庄,050081
摘    要:利用CCD传感器对工件进行测量是非接触测量领域的常用方法,本文介绍了一种基于线阵CCD器件TCD1206的微器件尺寸测量系统的设计方法,对系统的组成原理和工作方式进行了论证,硬件部分使用了Altera公司的CPI.D器件,实验表明系统设计方案可行,测量精度达到土0.01mm,符合设计要求。

关 键 词:线阵CCD  非接触测量  测量精度

Research of size measurement system of linear CCD based on CPLD
QIN Xu-lei,SUN Zhen-lu,LU Xue-fei. Research of size measurement system of linear CCD based on CPLD[J]. Journal of The Hebei Academy of Sciences, 2011, 28(4): 7-9,21
Authors:QIN Xu-lei  SUN Zhen-lu  LU Xue-fei
Affiliation:1(1.Changchun University of Science and Technology,Changchun Jilin 130022,China; 2.Institute of Laser,Hebei Academy of Sciences,Shijiazhuang Hebei 050081,China)
Abstract:The using of CCD sensor on the work piece measurement is one usual measurement of non-contact methods.The paper introduces a kind of design method of size measurement system which based on the linear CCD device TCD1206 and demonstrates that the composition principles and working methods of system.The hardware part of system use Altera′s CPLD device.The experiment shows that the proposal of system design is feasible,measurement accuracy reaches ±0.01mm,complies with the design requirements.
Keywords:Linear CCD  Non-contact measurement  Precision of measurement
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