| 支持向量机在小子样IC可靠性评估中的应用 |
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| 引用本文： | 邹心遥,姚若河.支持向量机在小子样IC可靠性评估中的应用[J].华南理工大学学报(自然科学版),2009,37(1). |
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| 作者姓名： | 邹心遥 姚若河 |
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| 作者单位： | 华南理工大学,电子与信息学院,广东,广州,510640 |
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| 摘 要： | 小子样问题是IC可靠性评估中急待解决的客观问题，本文从工程实践的实际需求出发，提出了基于支持向量机的小子样可靠性评估方法，并给出了支持向量机在栅氧化层击穿寿命分布评估中的应用实例。通过与常规的最小二乘评估方法相比，其评估精度有了很大的提高，试验结果分析能更真实地反应栅氧化层的可靠性特点。
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| 关 键 词： | 支持向量机 可靠性评估 最小二乘法 IC 统计分布 |
| 收稿时间： | 2008-1-8 |
| 修稿时间： | 2008-4-14 |
The Application of SupportVector Machines in the Evaluating of Small Sample IC Reliability |
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| Zou Xin-yao,Yao Ruo-he.The Application of SupportVector Machines in the Evaluating of Small Sample IC Reliability[J].Journal of South China University of Technology(Natural Science Edition),2009,37(1). |
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| Authors: | Zou Xin-yao Yao Ruo-he |
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| Abstract: | It is an urgent problem in reference to the evaluation of IC reliability that there usually are small samples in practice. In view of the small sample testing data and its specific property, a new reliability evaluation method based on least squares support vector machines is proposed. And the application of this method on lifetime distribution of gate oxide is presented. The obtained results show that this method can be used to determine the distribution with high accuracy by comparing it with least squares regression method. |
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| Keywords: | support vector machines reliability evaluation least squares regression IC statistics distribution |
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