高功率半导体激光器的电噪声

对高功率量子阱半导体激光器的爆破噪声和可能来自相同缺陷源的产生复合噪声（g-r噪声）进行了研究. 实验结果表明, 如果老化电流远高于阈值电流I_th, 爆破噪声和g-r噪声将会被引入, 甚至会出现多重g-r噪声. 通过对比样品老化前后光电导数的特征参量发现, 老化后产生爆破噪声和g-r噪声的器件为失效器件, 表明高功率量子阱半导体激光器在使用和老化过程中有时会伴有爆破噪声和g-r噪声. 通过缺陷能级理论和p-n结势垒高度变化, 讨论了爆破噪声、 g-r噪声及多重g-r噪声产生的原因.

The Electric Noise of High-power Semiconductor Laser

The burst and g-r (generation-recombination) noise in high-power quantum well semiconductor lasers were studied theoretically and experimentally. The results indicate that they are related with the aging current. Maybe they come from the same defects source. If the aging current is much larger than the threshold current I_ th , the burst noise and the g-r noise will be induced, even multi-g-r noise appears. By comparing the characteristic parameters of optic and electric derivative curves before and after aging, it is discovered that the device which produces burst and g-r noise after aging is failure device. The reasons of producing burst, g-r noise and multi-g-r noise are discussed on the basis of the theory of the defect energy level E_t and the variation of the height of the potential barrier of p-n junction.