| 光电二极管暗电流温度特性的测量 |
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| 引用本文： | 潘永惠,徐标,朱小松. 光电二极管暗电流温度特性的测量[J]. 南京师大学报(自然科学版), 1999, 22(2): 40-43 |
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| 作者姓名： | 潘永惠 徐标 朱小松 |
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| 作者单位： | 南京师范大学物理系 |
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| 摘 要： | 介绍了一种光电二极管暗电流温度特性的测量系统，该系统采用了热电致冷器件和高精度的微电流计，非常适合测量一些小型光电器件的温度特性．还对测量数据进行了分析，所得结果对光电检测系统的设计也具有一定的参考价值
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| 关 键 词： | 光电二极管 暗电流 热电致冷器件 微电流计 |
| 修稿时间： | 1998-03-21 |
The Measurement of Dark Current Temperature Dependence of Photodiodes |
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| Pan Yonghui,Xu Biao,Zhu Xiaosong. The Measurement of Dark Current Temperature Dependence of Photodiodes[J]. Journal of Nanjing Normal University(Natural Science Edition), 1999, 22(2): 40-43 |
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| Authors: | Pan Yonghui Xu Biao Zhu Xiaosong |
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| Abstract: | A kind of system measuring dark current temperature dependence of photodiodes is introduced. This system made by Peltier and highly precise microammeter is very useful to measure the temperature dependence of some small-size photoelectricity devices.The results from which are helpful to design of photoelectricity measurement system. |
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| Keywords: | Photodiodes dark current Peltier microammeter |
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