| 部分扫描设计中扫描链的选取 |
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| 引用本文： | 叶波,胡军.部分扫描设计中扫描链的选取[J].复旦学报(自然科学版),1995,34(5):591-595. |
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| 作者姓名： | 叶波 胡军 |
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| 作者单位： | 复旦大学电子工程系 |
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| 摘 要： | 提出了部分扫描可测性设计中扫描链的选取方法，选取最小的触发器集至扫描链能打断电路中所有的反馈，同时使得电路成为流水线结构，采用组合电路的测试生成算法，理论上对于所有的非冗余故障可达到完全的故障覆盖率。
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| 关 键 词： | 部分扫描 可测性设计 扫描链 时序电路 |
Selection of scan chain in partial scan design |
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| Ye Bo,Hu Jun,Zheng Zengyu.Selection of scan chain in partial scan design[J].Journal of Fudan University(Natural Science),1995,34(5):591-595. |
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| Authors: | Ye Bo Hu Jun Zheng Zengyu |
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| Institution: | ASIC & System State Key Laboratory |
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| Abstract: | The methodology of selecting scan chain in Partial Scan Testability Design is illustrated in this paper. The minimum set of Flip-Flops is selected to scan chain so that all feedbacks to other Flip-Flops can be broken up and the circuit be streamlined structure. Combinational test generation test generation algorithm is used to produce test vectors. Theoretically all faults(excluding redundant faults) can be detected. |
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| Keywords: | artial scan design for testability scan chain feedback streamlined structure |
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