| Five modified boundary scan adaptive test generation algorithms |
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| 作者姓名： | Niu Chunping Ren Zheping & Yao Zongzhong The Academy of Armored Force Engineering Beijing P.R. China |
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| 作者单位： | Niu Chunping，Ren Zheping & Yao Zongzhong The Academy of Armored Force Engineering，Beijing 100072，P.R. China |
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| 摘 要： | 1. INTRODUCTION In the process of applying boundary scan technologyto improve the testability of circuit board, the taskafter the boundary scan design for circuit board is togenerate test vectors for it, namely, the test generationalgorithm. Usually, according to the information usedin the test generation algorithm, the test generationalgorithm falls into three types: first, traditionaboundary scan test generation algorithm such asMCSA1], WOA 2] and equal weight algorithm 3~5]they al…
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| 收稿时间： | 21 June 2005. |
Five modified boundary scan adaptive test generation algorithms |
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| Niu Chunping,Ren Zheping & Yao Zongzhong The Academy of Armored Force Engineering,Beijing ,P.R. China.Five modified boundary scan adaptive test generation algorithms[J].Journal of Systems Engineering and Electronics,2006,17(4):760-763, 768. |
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| Authors: | Niu Chunping Ren Zheping Yao Zongzhong |
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| Institution: | The Academy of Armored Force Engineering, Beijing 100072, P.R. China |
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| Abstract: | |
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| Keywords: | boundary scan adaptive test interconnect test algorithm |
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