Low power and high speed explicit-pulsed double-edge triggered level converting flip-flop

Variable supply voltage-clustered voltage scaling (VS-CVS) scheme can be very effective in reducing power consumption of CMOS circuits without degrading system performance. Level converting flip-flops (LCFFs) are key elements in the CVS scheme. In this paper, a new explicit-pulsed double-edge triggered level converting flip-flop (nEP-DET-LCFF) is proposed, which employs double-edge triggering technique, dynamic structure, explicit pulse generator,conditional discharge technique and proper arrangement of stacked nMOS transistors to efficiently perform latching and level converting functions simultaneously. The proposed nEP-DET-LCFF combines merits of both conventional explicit-LCFFs and implicit-LCFFs. Simulation shows the proposed nEP-DET-LCFF has improvement of 19.2%～46% in delay, and 19.4%～52.9% in power-delay product (PDP) as compared with the published LCFFs.