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正电子谱学技术在功能材料微结构表征中的应用
引用本文:张礼红,成斌,张杰,张丽娟,郭卫锋,刘建党,张礼楠,叶邦角. 正电子谱学技术在功能材料微结构表征中的应用[J]. 中国科学:物理学 力学 天文学, 2012, 0(11): 1217-1225
作者姓名:张礼红  成斌  张杰  张丽娟  郭卫锋  刘建党  张礼楠  叶邦角
作者单位:中国科学技术大学近代物理系,合肥230026
基金项目:国家自然科学基金资助项目(批准号:11175171 11105139 10835006)
摘    要:特殊功能材料是一些具有优良电学、磁学、学、热学、学、力学、化学、物医学功能,在各类高科技领域到泛应用.正电子湮没技术是一种对材料微结构特别有效探测技术,特别是对各种缺陷、空位和微孔尤为灵敏,通过正电子湮没寿命谱、多普勒展宽谱和慢正电子束技术,通过分析正电子湮没参数可以获材料从表面到内部缺陷分布信息和随外部物理和化学条件变化、引起微结构变化.本文选取几种特殊材料正电子湮没实验结果来分析材料内部微结构,表明正电子湮没谱学是一种独特研究微观结构方法.

关 键 词:正电子谱学  微结构  功能材料  缺陷

Microstructure of functional materials probed by positron annihilation spectroscopy
ZHANG LiHong,CHENG Bin,ZhANG Jie,ZHANG LiJuan,GUO WeiFeng,LIU JianDang,ZHANG LiNan & YE BangJiao. Microstructure of functional materials probed by positron annihilation spectroscopy[J]. SCIENCE CHINA Physics, Mechanics & Astronomy, 2012, 0(11): 1217-1225
Authors:ZHANG LiHong  CHENG Bin  ZhANG Jie  ZHANG LiJuan  GUO WeiFeng  LIU JianDang  ZHANG LiNan & YE BangJiao
Affiliation:(Department of Modern Physics,University of Science and Technology of China,Hefei 230026,China )
Abstract:Functional materials which have excellent performances in electrics,magnetics,optics,calorifics,acoustics,mec-hanics,chemistry and biomedicine are widely used in the various high-tech field.Positron annihilation spectroscopy,including positron annihilation lifetime spectroscopy,Doppler broadening spectroscopy and slow positron beam technique,which is especially sensitive to detect various defects,vacancies and microvoids,is a very effectual method to probe the microstructure of materials.Defecs distribution information from the surface to the inner and microstructure variation due to external physical and chemical condition gradual change can be obtained by refined analysis of positron annihilation parameters.Microstructure of Several types of functional materials was studied by positron annihilation spectroscopy.It's proved that positron annihilation spectroscopy is a unique technique to study the microstructure of materials.
Keywords:positron annihilation spectroscopy  fnuctional material  microstructure  defect
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