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无失效数据下计算装置贮存寿命评估方法
引用本文:赵晓东,穆希辉.无失效数据下计算装置贮存寿命评估方法[J].系统工程与电子技术,2021,43(1):272-278.
作者姓名:赵晓东  穆希辉
作者单位:1. 陆军工程大学石家庄校区弹药工程系, 河北 石家庄 0500032. 中国人民解放军32181部队, 河北 石家庄 050003
基金项目:国家自然科学基金(61471385);装备预先研究基金重点项目(6140004030201);中国博士后科学基金(2013M532181)
摘    要:针对信息化弹药部组件贮存寿命难以评估的问题,提出了一种融合自然贮存试验数据与加速试验无失效数据的部组件贮存寿命评估方法.首先,根据部组件的自然贮存试验数据,通过保序回归解决数据中的倒挂问题,采用极小卡方估计法和拟合优度检验初步确定部组件的寿命分布函数.接着,通过最优置信限法,估计加速应力水平下的模型参数,并计算加速应力...

关 键 词:计算装置  无失效数据  自然贮存试验  贮存寿命  最优置信限
收稿时间:2020-02-22

Evaluation method for storage life of computing devices under zero-failure data
Xiaodong ZHAO,Xihui MU.Evaluation method for storage life of computing devices under zero-failure data[J].System Engineering and Electronics,2021,43(1):272-278.
Authors:Xiaodong ZHAO  Xihui MU
Institution:1. Department of Ammunition Engineering, Shijiazhuang Campus of Army Engineering University, Shijiazhuang 050003, China2. Unit 32181 of the PLA, Shijiazhuang 050003, China
Abstract:Aiming at the problem that it is difficult to evaluate the storage life of informationized ammunition components, a component storage life evaluation method combining natural storage test data and accelerated test zero-failure data is proposed. Firstly, according to the natural storage test data of the component, the upside down problem in the data is solved by the isotonic regression, and the life distribution function of the component is initially determined by the minimum chi-square estimation method and the goodness of fit test. Then, through the optimal confidence limit method, the model parameters under the accelerated stress level are estimated, and the acceleration factor between the accelerated stress level and the conventional stress level is calculated, and the zero-failure data in the accelerated test is converted to the timing censored data under normal stress levels, and the model parameters are re-evaluated based on that data alone. Furthermore, the conversion data and the original natural storage data are combined, and the storage reliability of the components is evaluated again, and the evaluation results are comprehensively compared to determine the distribution function. Finally, taking a computing device as an example, comprehensively comparing and analyzing the evaluation results of natural storage test data, accelerated test no-failure data, and fusion storage test data, the life distribution function of the computing device and the storage life at a given reliability are determined. The effectiveness of this method is proved, which can be used to promote the engineering applications.
Keywords:computing device  zero-failure data  natural storage test  storage life  optimal confidence limit  
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