| 电容铝箔微观结构的TEM和X射线衍射研究 |
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| 引用本文： | 张纬斌,刘武.电容铝箔微观结构的TEM和X射线衍射研究[J].中南大学学报(自然科学版),1987(1). |
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| 作者姓名： | 张纬斌 刘武 |
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| 作者单位： | 中南矿冶学院材料科学与工程系，中南矿冶学院材料科学与工程系 |
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| 摘 要： | 本文采用不同形变热处理高纯铝箔,经电解抛光和减薄后,用高压透射电镜观测了蚀坑形貌与其它微观结构,同时根据 X 射线晶面衍射强度分析,建立了铝箔易见蚀坑形貌与高 F_(hkl)值的实质联系,为制取高比电容铝箔,提供了理论依据.
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| 关 键 词： | 电解电容器 铝 金属箔 透射电子显微术 形态分析 显微结构 X射线衍射强度 形变热处理 |
TEM AND X-RAY ANALYSIS OF THE MICROSTRUCTURES OF CAPACITOR ALUMINUM FOIL |
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| Zhang WeiBin Liu Wu.TEM AND X-RAY ANALYSIS OF THE MICROSTRUCTURES OF CAPACITOR ALUMINUM FOIL[J].Journal of Central South University:Science and Technology,1987(1). |
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| Authors: | Zhang WeiBin Liu Wu |
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| Institution: | Department of Materials Science and Engineering |
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| Abstract: | In this article,high purity aluminum foils after different thermo-mechanical treatment were used as samples.The samples underwent electrolytic polishing and thining and the etching pit morphology and other microstructures were observed with H-800EM.The crystalline orientations were measured with X-ray analysis.
An essential relation of the easily visible etching pit morphology to the high F_(hkl)value was found.On its theoretical basis some principles were proposed for making capacitor aluminum foil. |
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| Keywords: | electrolytic capacitors aluminum metal foils transmission electron microscopy(TEM) morphological analysis microstructure intensity of X-ray diffraction |
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