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膜基组件的微硬度量测与膜体力学参数的顺序辨识
引用本文:黄建明,杨卫. 膜基组件的微硬度量测与膜体力学参数的顺序辨识[J]. 应用基础与工程科学学报, 1995, 0(1)
作者姓名:黄建明  杨卫
作者单位:清华大学工程力学系,清华大学工程力学系 北京 100084,北京 100084
摘    要:本文采用量纲分析得到膜基组件微硬度量测的若干标度律,并在分阶段辨识模型下应用轴对称弹塑性有限元计算对膜体的力学参数(弹性模量、屈服应力)进行了顺序辨识。

关 键 词:膜基组件  微硬度  弹塑性有限元法  力学参数辨识

Micro-indentation of Film-Substrate Structures and Sequential Cognition for Film Mechanical Parameters
HUANG Jianming YANG Wei. Micro-indentation of Film-Substrate Structures and Sequential Cognition for Film Mechanical Parameters[J]. Journal of Basic Science and Engineering, 1995, 0(1)
Authors:HUANG Jianming YANG Wei
Abstract:Several scaling laws in the micro-indentation measurements of film-substrate structures are discussed in the present paper by a dimentsional analysis. Sequential cognition for the mechanical parameters of films (such as the elastic modulus and yielding stress of films) is outlined incorporating with the axe-symmetrical elastic-plastic finite element analysis for the micro-indentation processes.
Keywords:Film-Substrate Structures   Micro-Indentation   Elastic-Pastic Fi- nite Element Method   Cognition for Mechanical Parameters
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