| 一种校正基体效应的方法 |
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| 引用本文： | 葛良全,章晔. 一种校正基体效应的方法[J]. 成都理工大学学报(自然科学版), 1990, 0(4) |
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| 作者姓名： | 葛良全 章晔 |
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| 作者单位： | 成都地质学院三系，中国地质大学 北京 |
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| 摘 要： | 介绍了一种实用的校正基体效应的方法。该方法在某铅锌矿2号矿体群的应用表明:X射线荧光法分析结果与化学分析结果相比较,在规定的允许偶然误差限内,对铅和锌其合格率分别为81%和79%,X射线荧光法重复分析铅、锌含量的平均相对误差均小于1%。
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| 关 键 词： | X射线荧光分析 基体效应 铅锌矿 |
A METHOD OF MATRIX CORRECTION |
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| Ge Liangquan,Zhang Ye. A METHOD OF MATRIX CORRECTION[J]. Journal of Chengdu University of Technology: Sci & Technol Ed, 1990, 0(4) |
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| Authors: | Ge Liangquan Zhang Ye |
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| Affiliation: | Ge Liangquan;Zhang Ye |
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| Abstract: | A practical method of correcting matrix effect is described. Test on Pb-Zn orebody groupNo 2 in a Pb-Zn deposit shows that within the range of allowable accidental error the samples analyzedby XRF analysis technique have a acceptance ratio of 81%Pb and 79%Zn in comparison with chemi-cal analysis, and that the average relative error of repeated analysis by XRF method is less than 1%. |
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| Keywords: | X-ray fluorescence analysis matrix effect Pb-Zn deposit |
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