| 非晶态Ni－Si－B系合金结构驰豫的电阻法研究 |
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| 引用本文： | 刘让苏,李基永,王玲玲,欧阳宇剑. 非晶态Ni－Si－B系合金结构驰豫的电阻法研究[J]. 湖南大学学报(自然科学版), 1994, 21(2) |
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| 作者姓名： | 刘让苏 李基永 王玲玲 欧阳宇剑 |
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| 摘 要： | 本文通过精密测定非晶态Ｎｉ－Ｓｉ－Ｂ系合金的电阻率在不同温度下等时退火后的变化，研究了该合金的结构驰豫过程，得到其电阻率变化随退火温度而作振荡性起伏的关系曲线，并利用作者提出的结构缺陷形成机制对该振荡性曲线作出了比较合理的微观机理解释。
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| 关 键 词： | 非晶态合金，结构驰豫，Ni－Si－B系合金，电阻法测量，等时退火，热稳定性能 |
Study of Structural Relaxation of Amorphous Ni-Si-BSystem Alloys by Electrical Resistivity Measurements |
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| Liu Rangsu Li Jiyong Wang Lingling Ouyang YuJian. Study of Structural Relaxation of Amorphous Ni-Si-BSystem Alloys by Electrical Resistivity Measurements[J]. Journal of Hunan University(Naturnal Science), 1994, 21(2) |
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| Authors: | Liu Rangsu Li Jiyong Wang Lingling Ouyang YuJian |
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| Affiliation: | Department of Applied Physics Hunan Univ |
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| Abstract: | In this paper,the processes of structural relaxation of amorphous Ni-Si-B system alloys have been studied by means of measuring the changes of elctrical resis-tivity of them after isochronal annealing at various temperatures,and the oscillatingcurves relating the electrical resistivity changes to the annealing temperatures have beenobtained.For the microscopic mechanism of these curves,a rather reasonable explana-tion has been made by the forming mechanism of structural defects proposed by authorsrecently. |
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| Keywords: | amorphous alloys structural relaxation Ni-Si-B system alloys elec-trical resistivity measurement isochronal annealing thermostability |
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