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基于MSP430F169的集成运放参数测试仪设计
引用本文:周金治,吴静,范富宏,董春岳. 基于MSP430F169的集成运放参数测试仪设计[J]. 西南科技大学学报, 2006, 21(2): 59-62
作者姓名:周金治  吴静  范富宏  董春岳
作者单位:西南科技大学信息工程学院,四川,绵阳,621010
基金项目:四川省应用基础研究计划项目(03JY029-017-2)
摘    要:介绍了以MSP430F169单片机为核心的集成运放参数测试仪的设计。阐述了运用辅助放大器法测量集成运算放大器参数的原理,并对单片机控制选择测量参数、切换量程和单片机处理数据的过程做了详细的论述。实验结果表明该测试仪能准确测量运算放大器的输入失调电压、输入失调电流、交流差模开环电压增益和交流共模抑制比等参数。

关 键 词:集成运放  参数测量  MSP430F169  数据处理
文章编号:1671-8755(2006)02-0059-04
收稿时间:2005-11-30
修稿时间:2005-11-30

Design of Parameter Measure Device for Integrated Operational Amplifier (IOA) Based on MSP430F169
ZHOU Jin-zhi,WU Jing,FAN Fu-hong,DONG Chun-yue. Design of Parameter Measure Device for Integrated Operational Amplifier (IOA) Based on MSP430F169[J]. Journal of Southwest University of Science and Technology, 2006, 21(2): 59-62
Authors:ZHOU Jin-zhi  WU Jing  FAN Fu-hong  DONG Chun-yue
Affiliation:School of Information Engineering, Southwest University of Science and Technology, Mianyang 621010, Sichuan, China
Abstract:On introducing the principle of measuring the parameter of IOA by applying assistant amplifiers,details are given on how to determine the controlling parameter,how to switch its measuring range and how to process its data of the single chip computer.Experimental results show that the device can precisely measure many parameters of IOA,such as input offset voltage,input offset current,open loop differential AC voltage gain and AC common mode rejection ratio.
Keywords:Integrated Operational Amplifier  parameter measure  MSP430F169  data processing
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