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从高斯光束到帽顶光束Z扫描:分析测量灵敏度和可靠性
引用本文:左平,顾兵,谈苏庆,黄晓琴. 从高斯光束到帽顶光束Z扫描:分析测量灵敏度和可靠性[J]. 南京师大学报(自然科学版), 2009, 32(1)
作者姓名:左平  顾兵  谈苏庆  黄晓琴
作者单位:南京师范大学物理科学与技术学院,江苏省光电技术重点实验室,江苏,南京,210097  
基金项目:国家自然科学基金,江苏省高校自然科学研究计划 
摘    要:利用快速傅里叶变换方法分析了Z扫描归一化透过率曲线.研究了入射光束空间分布对Z扫描测量灵敏度和可靠性的影响.提出了截取高斯光束(即近帽顶光束)Z扫描表征技术,该技术不仅提高了测量灵敏度和可靠性,而且提高了光能量的利用率.

关 键 词:Z扫描  灵敏度  可靠性  近帽顶光束

From Gaussian Beams to Top-hat Beams Z-scan:Analysis of Sensitivity and Reliability
Zuo Ping,Gu Bing,Tan Suqing,Huang Xiaoqin. From Gaussian Beams to Top-hat Beams Z-scan:Analysis of Sensitivity and Reliability[J]. Journal of Nanjing Normal University(Natural Science Edition), 2009, 32(1)
Authors:Zuo Ping  Gu Bing  Tan Suqing  Huang Xiaoqin
Affiliation:Jiangsu Key Laboratory on Opto-Electronic Technology;School of Physics Science and Technology;Nanjing Normal University;Nanjing 210097;China
Abstract:The normalized transmittance of Z-scan traces,by using the fast Fourier Transform(FFT)method,was analyzed.The influence of the spatial profile beam of input laser on the sensitivity and reliability in Z-scan measurements was discussed in detail.The clip Gaussian beams(i.e.,near top-hat beams)Z-scan technique,which improves the sensitivity,the reliability of measurements,and the efficiency in use of the input laser energy was presented.
Keywords:Z-scan  sensitivity  reliability  near top-hat beams  
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