Study on MCM Interconnect Test Generation Based on Ant Algorithm with Mutation Operator

Introduction With rapid development of very large scale in-tegration(VLSI),multi-chip module(MCM)andmulti-layer printed circuit boards(MPCB),inter-connect test technology has become a bottleneckinthe application of these circuits.The high reliabili-ty of MCMis due to that bare integrated circuitchips are welded and interconnected under highdensity and small di mension conditions[1].Testgenerationis one key technologies of MCMinter-connect test,so study on novel method of test gen-eratio…

Study on MCM Interconnect Test Generation Based on Ant Algorithm with Mutation Operator

A novel multi-chip module(MCM) interconnect test generation scheme based on ant algorithm(AA) with mutation operator was presented.By combing the characteristics of MCM interconnect test generation,the pheromone updating rule and state transition rule of AA is designed.Using mutation operator,this scheme overcomes ordinary AA's defects of slow convergence speed,easy to get stagnate,and low ability of full search.The international standard MCM benchmark circuit provided by the MCNC group was used to verify the approach.The results of simulation experiments,which compare to the results of standard ant algorithm,genetic algorithm(GA) and other deterministic interconnecting algorithms,show that the proposed scheme can achieve high fault coverage,compact test set and short CPU time,that it is a newer optimized method deserving research.