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Study of titanium nitride for Iow-e coating application
作者姓名:ZHENG  PengFei  ZHAO  GaoLing  ZHANG  TianBo  WU  LiQing  WANG  JianXun  HAN  GaoRong
作者单位:State Key Laboratory of Silicon Materials, Department of Materials Science and Engineering, Zhejiang University, Hangzhou 310027,China
基金项目:Supported by the National Natural Science Foundation of China (Grant Nos. 50372060 and 50672086)
摘    要:The paper reports our novel work on chemical vapor deposition coating of titanium nitride (TIN) thin film on glass for energy saving. TiN films were deposited on glass substrates by atmospheric pressure chemical vapor deposition (APCVD) using titanium tetrachloride (TiCl4) and ammonia (NH3) as precursors. As a result, TiN films with a thickness of 500 nm were obtained. X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM), four-point probe method and optical spectroscopy were respectively employed to study the crystallization, microstructure, surface morphology, electrical and optical properties of the coated TiN films. The deposited TiN films are of NaCI structure with a preferred (200) orientation. The particles in the film are uniform. The reflectivity of the TiN coating in the near-infrared (NIR) band can reach over 40%, the visible transmittance is approximately 60%, and the visible refiectivity is lower than 10%. The sheet electrical resistance is 34.5 Ω. According to Drude theory, the lower sheet resistance of 34.5 Ω gives a high reflectivity of 71.5% around middle-far infrared band. The coated films exhibit good energy-saving performance.

关 键 词:氮化钛  大气压  化学元素  蒸汽
收稿时间:24 November 2006
修稿时间:2006-11-242007-04-03

Study of titanium nitride for low-e coating application
ZHENG PengFei ZHAO GaoLing ZHANG TianBo WU LiQing WANG JianXun HAN GaoRong.Study of titanium nitride for Iow-e coating application[J].Chinese Science Bulletin,2007,52(13):1860-1863.
Authors:Zheng PengFei  Zhao GaoLing  Zhang TianBo  Wu LiQing  Wang JianXun  Han GaoRong
Institution:(1) State Key Laboratory of Silicon Materials, Department of Materials Science and Engineering, Zhejiang University, Hangzhou, 310027, China
Abstract:The paper reports our novel work on chemical vapor deposition coating of titanium nitride (TiN) thin film on glass for energy saving. TiN films were deposited on glass substrates by atmospheric pressure chemical vapor deposition (APCVD) using titanium tetrachloride (TiCl4) and ammonia (NH3) as precursors. As a result, TiN films with a thickness of 500 nm were obtained. X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM), four-point probe method and optical spectroscopy were respectively employed to study the crystallization, microstructure, surface morphology, electrical and optical properties of the coated TiN films. The deposited TiN films are of NaCl structure with a preferred (200) orientation. The particles in the film are uniform. The reflectivity of the TiN coating in the near-infrared (NIR) band can reach over 40%, the visible transmittance is approximately 60%, and the visible reflectivity is lower than 10%. The sheet electrical resistance is 34.5 Ω. According to Drude theory, the lower sheet resistance of 34.5 Ω gives a high reflectivity of 71.5% around middle-far infrared band. The coated films exhibit good energy-saving performance. Supported by the National Natural Science Foundation of China (Grant Nos. 50372060 and 50672086)
Keywords:titanium nitride  atmospheric pressure chemical vapor deposition (APCVD)  optical properties  low-emission
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